High Resolution Imaging and Analysis of Embedded Interfaces and Interface Phase Transitions in Interface-Dominated Nanomaterials

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Heterogeneous nanostructured materials and assemblies offer unique structure-property relationships, dominated by the internal interfaces they contain. This interdisciplinary research project will combine novel techniques based on high-resolution phase-retrieval x-ray diffraction and imaging, with complementary analytical electron microscopy and atom probe analysis, in a coordinated study of the structure and properties of embedded interfaces in strategic bi-crystals and nanostructures. It promises new techniques for the study of such defects, and a breakthrough in the understanding of the structural transitions that occur in embedded interfaces as a function of local changes in composition and temperature.