High Resolution Imaging and Analysis of Embedded Interfaces and Interface Phase Transitions in Interface-Dominated Nanomaterials

界面主导纳米材料中嵌入式界面和界面相变的高分辨率成像和分析

• 批准号: DP0453333
• 负责人: Prof Barrington Muddle
• 金额: $ 39.69万
• 依托单位: Monash University
• 依托单位国家: 澳大利亚
• 项目类别: Discovery Projects
• 财政年份: 2004
• 资助国家: 澳大利亚
• 起止时间: 2004-01-01 至 2007-12-31
• 项目状态: 已结题
• 来源: https://dataportal.arc.gov.au/RGS/Web/Grants/DP0453333
• 关键词: Resolution; Imaging; Analysis; Embedded; Interfaces

Heterogeneous nanostructured materials and assemblies offer unique structure-property relationships, dominated by the internal interfaces they contain. This interdisciplinary research project will combine novel techniques based on high-resolution phase-retrieval x-ray diffraction and imaging, with complementary analytical electron microscopy and atom probe analysis, in a coordinated study of the structure and properties of embedded interfaces in strategic bi-crystals and nanostructures. It promises new techniques for the study of such defects, and a breakthrough in the understanding of the structural transitions that occur in embedded interfaces as a function of local changes in composition and temperature.

非均质纳米结构材料和组件提供了独特的结构-性能关系，由其包含的内部界面主导。这个跨学科的研究项目将结合基于高分辨率相位恢复x射线衍射和成像的新技术，与互补的分析电子显微镜和原子探针分析，在战略双晶和纳米结构中嵌入界面的结构和性质的协调研究。它有望为研究这些缺陷提供新技术，并在理解嵌入式界面中发生的结构转变作为局部成分和温度变化的函数方面取得突破。