Accelerator Mass Spectrometry (AMS) by Application of inverse PIXE Method

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For application of the inverse PIXE method to 36C1-ANS and for establishment of a new X-ray detection AMS method, several technical developments have been done1 Detection efficiency of 36C1 by projectile X-ray measurementA thin Ti metal foil(0.9 mg/cm^2) target was bombarded with 35C1 and 328 beams(energy range of 80 MeV -20 Mev) from the Kyushu University tandem accelerator. High Cl KX-ray yield of about 0.5 for one Cl-ion injection at beam energy of 80 - 70 MeV has been confirmed by KX-ray measurements of Cl, S, Ti atoms using a high resolution Ge-detector.2 construction of a multi-sample Cs sputtering ion sourceAn AMS dedicated Cs sputtering ion source with a sample changer, which can mount 24 samples, has been constructed.3 Measurement of target Thickness using 241Am SourcesA precise measurement method of thin foil thickness has been developed with the fluorescence X-ray analysis technique by irradiation of the radiation(gamma rays, X rays and alpha rays) from 241Am source. In process of the measurement, it has been found that X-ray detection utilized alpha particles from RI source is very useful not only for thin thickness measurement but also as a portable PIXE system.