Study on Thermal Fatique Life Prediction of Micro Soldered Joints
微焊点热疲劳寿命预测研究
基本信息
- 批准号:09450044
- 负责人:
- 金额:$ 8.51万
- 依托单位:
- 依托单位国家:日本
- 项目类别:Grant-in-Aid for Scientific Research (B)
- 财政年份:1997
- 资助国家:日本
- 起止时间:1997 至 1999
- 项目状态:已结题
- 来源:
- 关键词:
项目摘要
Torsional fatigue tests and creep tests were carried out on a 60Sn-40Pb solder. In both tests three temperatures (303-333K) were used, and in the fatigue test five cycling frequencies (0.001-5.0Hz) were used. An evaluation method for the solder fatigue life under relatively high temperature or low cycling frequency was proposed from the test results, nothing that the characteristics of fatigue under the above mentioned conditions were similar to the creep characteristics. Furthermore, this evaluation method was applied to the estimation of the crack initiation life of through-hole-type joints. By comparing the estimated values with the experimental ones it was clarified that this method was valid for the assessment of the crack initiation life of solder joints.To predict the fatigue life of soldered joints owing to the cyclic bending of the substrates when carrying movable electronic equipments, we conducted the fatigue tests by bending the substrates cyclically. As a result of the fatigue tests, it was shown that the fracture life was predicted well by Manson-Coffin's law using the equivalent plastic strain ranges as parameters and the life prediction equation was determined. Furthermore, the easier prediction method that the fracture life was about five times the crack initiation life was obtained.Finally, the state of the art of the research on fatigue life prediction of micro soldered joints was reported.
对 60Sn-40Pb 焊料进行扭转疲劳试验和蠕变试验。在这两项测试中,使用了三种温度(303-333K),在疲劳测试中,使用了五种循环频率(0.001-5.0Hz)。根据试验结果,提出了在较高温度或较低循环频率下焊接疲劳寿命的评价方法,但上述条件下的疲劳特性与蠕变特性相似。此外,该评估方法还应用于通孔型接头裂纹萌生寿命的估算。通过将估计值与实验值进行比较,表明该方法对于焊点裂纹萌生寿命的评估是有效的。为了预测承载可移动电子设备时基板循环弯曲导致的焊点疲劳寿命,我们对基板进行了循环弯曲疲劳试验。疲劳试验的结果表明,使用等效塑性应变范围作为参数,曼森-柯芬定律可以很好地预测断裂寿命,并确定了寿命预测方程。此外,还得到了断裂寿命约为裂纹萌生寿命5倍的更简单的预测方法。最后,报告了微焊接接头疲劳寿命预测的研究现状。
项目成果
期刊论文数量(24)
专著数量(0)
科研奖励数量(0)
会议论文数量(0)
专利数量(0)
海老原理徳: "各種電子機器の実装技術と信頼性"エレクトロニクス実装学会編2010年までのエレクトロニクス実装の信頼性技術. 3-16 (1999)
海老原则之:《各种电子设备的安装技术和可靠性》电子封装协会编,电子封装的可靠性技术截至2010年。3-16(1999)
- DOI:
- 发表时间:
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- 影响因子:0
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- 通讯作者:
Y. Ebihara et al.: "Fatigue Strength Evaluation to BGA Package Solder Joints"J. of Japan Institute of Electronics Packaging. Vol. 1, No. 1. 53-57 (1998)
Y. Ebihara 等人:“BGA 封装焊点的疲劳强度评估”J。
- DOI:
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- 影响因子:0
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M. Taneda et al.: "Creep-Fatigue Life Evaluation of Solder Based on Creep Characteristics"Trans. Of the Japan Society of Mechanical Engineers (A). Vol. 64, No. 617. 50-57 (1998)
M. Taneda 等:“基于蠕变特性的焊料蠕变疲劳寿命评估”Trans。
- DOI:
- 发表时间:
- 期刊:
- 影响因子:0
- 作者:
- 通讯作者:
K. Kaminishi et al.: "Evaluation of Fatigue Crack Initiation and Extension Life in Microelectronics solder Joint of Surface-Mounted Type"Trans. Of the Japan Society of Mechanical Engineers (A). Vol. 64, No. 620. 871-878 (1998)
K. Kaminishi 等人:“表面安装型微电子焊点中疲劳裂纹萌生和延伸寿命的评估”Trans。
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種田元治、上西研、本廣誠二: "クリープ特性を基にしたはんだのクリープ疲労寿命評価法"日本機械学会論文集A編. 第64巻 第617号. 50-57 (1998)
Motoharu Taneda、Ken Uenishi、Seiji Motohiro:“基于蠕变特性的焊料蠕变疲劳寿命的评价方法”日本机械工程学会会刊,卷 A,卷 64,第 617 期,50-57(1998 年)
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