Study on Thermal Fatique Life Prediction of Micro Soldered Joints
Study on Thermal Fatique Life Prediction of Micro Soldered Joints
批准号:
09450044
负责人:
EBIHARA Yoshinori
金额:
$8.51万
依托单位:
依托单位国家:
日本
项目类别:
Grant-in-Aid for Scientific Research (B)
财政年份:
1997
资助国家:
日本
项目状态:
已结题
起止时间:
1997 至 1999
中文摘要
点击翻译按钮获取中文摘要
英文摘要
Torsional fatigue tests and creep tests were carried out on a 60Sn-40Pb solder. In both tests three temperatures (303-333K) were used, and in the fatigue test five cycling frequencies (0.001-5.0Hz) were used. An evaluation method for the solder fatigue life under relatively high temperature or low cycling frequency was proposed from the test results, nothing that the characteristics of fatigue under the above mentioned conditions were similar to the creep characteristics. Furthermore, this evaluation method was applied to the estimation of the crack initiation life of through-hole-type joints. By comparing the estimated values with the experimental ones it was clarified that this method was valid for the assessment of the crack initiation life of solder joints.To predict the fatigue life of soldered joints owing to the cyclic bending of the substrates when carrying movable electronic equipments, we conducted the fatigue tests by bending the substrates cyclically. As a result of the fatigue tests, it was shown that the fracture life was predicted well by Manson-Coffin's law using the equivalent plastic strain ranges as parameters and the life prediction equation was determined. Furthermore, the easier prediction method that the fracture life was about five times the crack initiation life was obtained.Finally, the state of the art of the research on fatigue life prediction of micro soldered joints was reported.
期刊论文(24)
专著(0)
科研奖励(0)
会议论文
登录
查看更多内容
海老原理徳: "各種電子機器の実装技術と信頼性"エレクトロニクス実装学会編2010年までのエレクトロニクス実装の信頼性技術. 3-16 (1999)
海老原则之:《各种电子设备的安装技术和可靠性》电子封装协会编,电子封装的可靠性技术截至2010年。3-16(1999)
DOI:
--
发表时间:
期刊:
影响因子:
--
作者:
[]
通讯作者:
Y. Ebihara et al.: "Fatigue Strength Evaluation to BGA Package Solder Joints"J. of Japan Institute of Electronics Packaging. Vol. 1, No. 1. 53-57 (1998)
Y. Ebihara 等人:“BGA 封装焊点的疲劳强度评估”J。
DOI:
--
发表时间:
期刊:
影响因子:
--
作者:
[]
通讯作者:
M. Taneda et al.: "Creep-Fatigue Life Evaluation of Solder Based on Creep Characteristics"Trans. Of the Japan Society of Mechanical Engineers (A). Vol. 64, No. 617. 50-57 (1998)
M. Taneda 等:“基于蠕变特性的焊料蠕变疲劳寿命评估”Trans。
DOI:
--
发表时间:
期刊:
影响因子:
--
作者:
[]
通讯作者:
K. Kaminishi et al.: "Evaluation of Fatigue Crack Initiation and Extension Life in Microelectronics solder Joint of Surface-Mounted Type"Trans. Of the Japan Society of Mechanical Engineers (A). Vol. 64, No. 620. 871-878 (1998)
K. Kaminishi 等人:“表面安装型微电子焊点中疲劳裂纹萌生和延伸寿命的评估”Trans。
DOI:
--
发表时间:
期刊:
影响因子:
--
作者:
[]
通讯作者:
種田元治、上西研、本廣誠二: "クリープ特性を基にしたはんだのクリープ疲労寿命評価法"日本機械学会論文集A編. 第64巻 第617号. 50-57 (1998)
Motoharu Taneda、Ken Uenishi、Seiji Motohiro:“基于蠕变特性的焊料蠕变疲劳寿命的评价方法”日本机械工程学会会刊,卷 A,卷 64,第 617 期,50-57(1998 年)
DOI:
--
发表时间:
期刊:
影响因子:
--
作者:
[]
通讯作者:
共 23 条
海外基金