Ion Beam Microsectioning Apparatus for Precision Measurement of Neutron Radiation-Enhanced Diffusion

本研究是为了制造一台用于精确测量中子辐射增强扩散在金属和合金中的离子束显微切割仪。中子辐照的扩散样品被离子束显微切片仪切割并沉积在Kapton膜上。沉积后，用闪烁计数器测量沉积的Kapton膜的活度，以了解扩散-穿透分布。该装置已成功制造并完全投入使用，可测量深度达200纳米的扩散穿透分布。在JMTR上进行了几次辐照实验。将沉积有10 nm铁膜的铝材在真空条件下封装在铝罐中，以防止辐照时的氧化。辐射扩散运行持续533小时。在400℃下放置168小时。在200摄氏度。辐照后，用离子束切片仪对样品进行切片，高精度地测定了扩散穿透分布。

The present research was undertaken to manufacture an ion beam microsectioning apparatus for precise measurements of neutron radiation-enhanced diffusion in metals and alloys. The neutronirradiated diffusion sample is sectioned by the ion-beam microsectioning apparatus and deposited onto Kapton films. After the deposition, the activity from the deposited Kapton films is measured by a scintillation counter to know the diffusion-penetration profiles. The apparatus was manufactured successfully and fully operated to measure the diffusion penetration profiles up to a depth of 200 nm.Several irradiation experiments were performed at the JMTR. The aluminum sample on which iron film of 10 nm was deposited was capsuled into aluminum can under a vacuum to prevent oxidation in irradiation. Radiation diffusion runs were carried out for 533 hr. at 400C and for 168 hr. at 200C. After irradiation the samples were sectioned by the ion-beam microsectioning apparatus and diffusion penetration profiles were determined with high precision.