Ion Beam Microsectioning Apparatus for Precision Measurement of Neutron Radiation-Enhanced Diffusion

本研究旨在研制一种用于金属和合金中子辐射增强扩散精确测量的离子束显微切片装置。中子辐照扩散样品的离子束显微切片设备和沉积到Kapton膜。在沉积之后，通过闪烁计数器测量来自所沉积的Kapton膜的活性以了解扩散-穿透分布。该装置制造成功，并充分运作，以测量的扩散渗透剖面达200 nm的深度。几个辐照实验进行了在JMTR。在真空下将其上沉积有10 nm的铁膜的铝样品封装到铝罐中以防止辐照中的氧化。在400 ℃下进行辐射扩散试验533小时，在200 ℃下进行辐射扩散试验168小时。辐照后的样品进行了切片的离子束显微切片装置和扩散渗透的轮廓测定与高精度。

The present research was undertaken to manufacture an ion beam microsectioning apparatus for precise measurements of neutron radiation-enhanced diffusion in metals and alloys. The neutronirradiated diffusion sample is sectioned by the ion-beam microsectioning apparatus and deposited onto Kapton films. After the deposition, the activity from the deposited Kapton films is measured by a scintillation counter to know the diffusion-penetration profiles. The apparatus was manufactured successfully and fully operated to measure the diffusion penetration profiles up to a depth of 200 nm.Several irradiation experiments were performed at the JMTR. The aluminum sample on which iron film of 10 nm was deposited was capsuled into aluminum can under a vacuum to prevent oxidation in irradiation. Radiation diffusion runs were carried out for 533 hr. at 400C and for 168 hr. at 200C. After irradiation the samples were sectioned by the ion-beam microsectioning apparatus and diffusion penetration profiles were determined with high precision.