X-Ray Photoelectron Spectrometer

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An X-ray photoelectron spectrometer is requested by working groups from the chemical institutes, the institute of materials science and the institute of micro production technology. The research device is to be used in various research projects:- as part of research on functional nanostructures at the Institute of Physical Chemistry and Electrochemistry in the investigation of structure-property correlations, namely1. Detailed characterization of surface chemistry and depth profile as well as determination of the local elementary distributions of size, shape and composition controlled semiconductor and metal nanoparticles as well as magnetic nanoparticles and their assemblies2. Determination of the conduction and valence band structure (also temperature-dependent measurements) of semiconductor nanoparticles, in particular of quantum dots, nanoparticle networks, nanorods and of 2D semiconductor nanostructures from colloid-chemical syntheses. Such characterizations are carried out on assemblies from the above mentioned particles3.Determination of the surface quality and depth profile of the chemical composition of nanostructured membranes (e.g. MXene-based membranes, mixed matrix membranes based on metal organic framework connections) and of various thermoelectric materials- as part of research on inorganic materials at the Institute of Inorganic Chemistry in the detailed analysis of the following structures:1. Investigations on implant-associated or -directed drug delivery systems (porous inorganic and hybrid materials): Testing the successful chemical modification of the surface of nanoparticles and implant surfaces (e.g. on silica, ceramics, phosphonate attachment on titanium dioxide, decoration of precious metal surfaces with thiols etc.) as well as electrochemically deposited materials2. Investigation of the spatial resolution of the drug release and binding on the upper micron scale on the above-mentioned porous materials for implant research to improve their functionality3. Comparison of the calculated electronic and optical properties of nanoporous optical, optoelectronic and electronic materials (mainly metal-organic framework connections) with experimentally available data from photoelectron spectroscopy in the X-ray and UV range and inverse photoelectron spectroscopy- as part of research at the Institute of Materials Science, the detailed characterization of metallic structural and functional materials and interfaces in metal/metal and metal/ceramic composites- as part of the research on sensors, actuators and other functional microstructures and systems manufactured at the Institute of Micro Production Technology for the chemical analysis of interfaces and the determination of material damage and depth profiles of various materials, for example through wear mechanisms in various production techniques