Development of Single Sheet Tester for Measuring Magnetic Characteristics of Amorphous Magnetic Metals

非晶磁性金属磁特性单片测试仪的研制

• 批准号: 06555080
• 负责人: NAKATA Takayoshi
• 金额: $ 1.98万
• 依托单位: Okayama University
• 依托单位国家: 日本
• 项目类别: Grant-in-Aid for Developmental Scientific Research (B)
• 财政年份: 1994
• 资助国家: 日本
• 起止时间: 1994 至 1995
• 项目状态: 已结题
• 来源: https://kaken.nii.ac.jp/grant/KAKENHI-PROJECT-06555080/
• 关键词: JIS Standard; IEC Standard; Amorphous Metal; Single Sheet Tester; Geomagnetism; Residual Magnetism; Distortion of Waveform; Intercomparison; Hコイル; 直流偏磁; ディジタルフィードバック

In order to propose a draft of "Standard measuring method of magnetic characteristics of amorphous metal for power apparatus" for the IEC,effects of geomagnetism and residual magnetism, etc.on measured magnetic characteristics were investigated. The results obtained can be summarized as follows :1.Effect of Geomagnetism on Measured Magnetic CharacteristicsThe results measured inside and outside a magnetic shielding room were compared with each other. It was shown that if the angle between the longitudinal direction of the specimen and the direction of geomagnetism is perpendicular, the performance of the double yoke type of single sheet tester outside the magnetic shielding room is acceptable.2.Effect of Residual Magnetism in the Yoke of Measured Magnetic CharacteristicsIt was shown that the effect residual magnetism in the horizontal yoke type of the single sheet tester is larger than that in the vertical one.3.Effect of Impedance of Winding on Distortion of Flux WaveformThe effects o … More f the impedances of the primary winding and the mutual inductor for air-flux compensation of the single sheet tester on the distortion of the flux waveform were investigated. It was shown that the layrs which compose the winding should be connected in series.4.Improvement of Waveform Controlling MethodIn order to reduce the number of iterations of digital feedbacks, a new controlling method for the waveform which estimates the waveform of the applied voltage using the equivalent circuit of the single sheet tester was developed. The time for measuring magnetic characteristics has been considerably reduced by using this method.5.Intercomparison of MeasurementsA Japanese intercomparison of measurements of the magnetic characteristics for amorphous magnetic material was carried out. The results of the institutes have been considerably different and the counter plan is being investigated now.Now, it is being tried to improve the existent JIS standard by the above investigation. The intercomparison between various countries is prepared in order to propose a new IEC standard. Less

为了向国际电工委员会（IEC）提出《电力设备用非晶态金属磁性测量标准方法》草案，研究了地磁和剩磁等因素对被测金属磁性的影响。所得结果可总结如下：1。地磁对测得磁特性的影响对屏蔽室内外的测量结果进行了比较。结果表明，当试件纵向与地磁方向夹角垂直时，双轭式单片试验机在磁屏蔽室外的性能是可以接受的。2 .磁特性测量中磁轭中残余磁性的影响研究表明，单片试验机水平磁轭中残余磁性的影响大于垂直磁轭中残余磁性的影响。绕组阻抗对磁通波形畸变的影响研究了单片测试仪初级绕组阻抗和空气磁通补偿互感器阻抗对磁通波形畸变的影响。结果表明，组成绕组的各层应串联连接。波形控制方法的改进为了减少数字反馈的迭代次数，提出了一种利用单片测试仪等效电路估计外加电压波形的波形控制方法。用这种方法测量磁特性的时间大大缩短了。测量结果的相互比较日本对非晶磁性材料的磁性特性进行了测量结果的相互比较。各研究所的结果大不相同，目前正在研究对策。目前，正试图通过上述调查来完善现有的JIS标准。各国之间的相互比较是为了提出一个新的IEC标准。少

项目成果

T.Nakata, N.Takahashi and K.Fujiwara: "Study of Horizontal-Type Single Sheet Testers" Journal of Magnetism and Magnetic Material Materials. vol.133. 416 (1994)

T.Nakata、N.Takahashi 和 K.Fujiwara：“卧式单片测试仪的研究”磁性和磁性材料杂志。

T.Nakata: "Improved Controlling of Waveform for Single Sheet Tester" Digests of the 18th Annual National Convention on Magnetics Society in Japan. 12aB-4. (1994)

T.Nakata：“单片测试仪波形的改进控制”日本磁学会第 18 届年度大会摘要。

中田高義: "単板磁気試験器の波形制御法の改良" 第18回日本応用磁気学会学術講演概要集. (1994)

中田隆吉：《单板磁力测试仪波形控制方法的改进》第十八届日本应用磁学学会学术会议摘要（1994年）

中田高義,高橋則雄,藤原耕二: "Numerical Analysisi of Flux Distributions in Cores Made of Anisotropic Material (Invited)" Journal of Magnetism and Magnetic Materials. 133. 377-381 (1994)

Takayoshi Nakata、Norio Takahashi、Koji Fujiwara：“由各向异性材料制成的磁芯中磁通分布的数值分析（特邀）”《磁性与磁性材料杂志》133. 377-381 (1994)。

N.Takahashi, T.Nakata and K.Fujiwara: "Effects of Impedances of Primary Winding and Mutual Inductor on Distortion of Flux Waveform in Single Sheet Tester" IEEE Trans.on Magnetics. vol.31, no.6. 3382 (1995)

N.Takahashi、T.Nakata 和 K.Fujiwara：“初级绕组和互感器的阻抗对单片测试仪中磁通波形失真的影响”IEEE Trans.on Magnetics。