Surface Analysis from Backside of the Surface

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It is important in analytical chemistry, natural science, or engineering, to study surfaces. In the surface analysis, the surface is irradiated by quanta called probing particle, and the resulted signal emitted from the surface is observed. However, sometimes, the surface cannot probed from the surface, because of the surface is in a hard environment to approach.In such a case, photo-acoustic spectroscopy, supersonic, or transmitted x-rays are used to probe the surface. The development of such a new surface analysis method is the aim of the present research. We have tried synchrotron radiation source x-ray absorption spectroscopy, photo-acoustic spectroscopy, and charge-up and discharge phenomena to develop surface analysis methods. We have obtained the following three important results.(1) x-ray emission due to charge-up effect.(2) Field emission of electrons using a new mechanism.(3) Surface and fine particle chemical analysis using sample current.