DEVELOPMENT OF AN ION MICROPROBE USING HIGH ENERGY ION BEAM

使用高能离子束的离子微生物探针的开发

• 批准号: 07554058
• 负责人: SUENO Shigeho
• 金额: $ 1.34万
• 依托单位: UNIVERSITY OF TSUKUBA
• 依托单位国家: 日本
• 项目类别: Grant-in-Aid for Scientific Research (A)
• 财政年份: 1995
• 资助国家: 日本
• 起止时间: 1995 至 1997
• 项目状态: 已结题
• 来源: https://kaken.nii.ac.jp/grant/KAKENHI-PROJECT-07554058/
• 关键词: ACCELERATOR,; PROTON BEAM,; PIXE,; MICRO AREA,; QUANTITATIVE ANALYSIS,; TRACE ELEMENT,; NON DESTRUCTIVE ANALYSIS; プロントビーム

We have developed a newly proton microprobe sample chamber designed for analysis of heterogeneous mineral samples. The sample chamber is equipped with a novel beam and sample optics, a computer-driven stage and external microscope and filter exchange system. Under the employed optical geometry, axs of beam and sample optics are collinear and normal to the sample surface, an essential aspect allowing high spatial resolution of analyzes and accurate, micrometer-scale sample and beam positioning. Use of a long working distance in conjunction with integral reflectance mirror are the primary design constraints satisfied for successful development. Based on measurements, the presented proton microprobe is expected to enhance studies requiring effective and easy to perform nondestructive microanalytical analysis of minerals.

我们研制了一种用于非均质矿物样品分析的质子微探针样品室。样品室配备了一个新的光束和样品光学系统，一个计算机驱动的阶段和外部显微镜和过滤器交换系统。在所采用的光学几何形状下，光束和样品光学器件的轴与样品表面共线且垂直，这是实现分析的高空间分辨率以及准确的微米级样品和光束定位的一个重要方面。长工作距离与整体反射镜的结合使用是成功开发所满足的主要设计约束。基于测量，提出的质子微探针，预计将加强研究，需要有效的和容易的进行无损微分析的矿物。

项目成果

S. Sueno: "High energy ionbeams: useful probes for mineral chemical analysis." European Journal of Mineralogy. 7. 1273-1297 (1995)

S. Sueno：“高能离子束：用于矿物化学分析的有用探针。”

Kurosawa, M.et al.: "Development of a sample chamber for micro-PIXE." Housyasen, (in Japanese with English abstract).23. 28-35 (1997)

Kurosawa, M.et al.：“微型 PIXE 样品室的开发。”

Kurosawa, M.et al.: "Quantitative trace element analyzes of silicate glasses and a stainless steel using the proton microprobe." Submitted to Chemical Geology. (1997)

Kurosawa, M.et al.：“使用质子微探针对硅酸盐玻璃和不锈钢进行定量微量元素分析。”

島 邦博: "半導体検出器によるX線スペクトルの読み方" 放射線. 23. 21-29 (1997)

Kunihiro Shima：“如何使用半导体探测器读取 X 射线光谱”放射学。23. 21-29 (1997)

Shima, K.: "Various components of X-ray spectra induced in X-ray semiconductor detector." Housyasen, (in Japanese with English abstract).23. 21-29 (1997)

Shima, K.：“X 射线半导体探测器中产生的 X 射线光谱的各种成分。”