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A study on the distribution and behavior of light elements in minerals and rocks

矿物和岩石中轻元素的分布和行为研究

基本信息

批准号：
60430015
负责人：
SUENO Shigeho
金额：
$ 10.24万
依托单位：
University of Tsukuba
依托单位国家：
日本
项目类别：
Grant-in-Aid for General Scientific Research (A)
财政年份：
1985
资助国家：
日本
起止时间：
1985 至 1988
项目状态：
已结题

项目摘要

The most of minerals and rocks are insulator and they have quite complicated chemical compositions. These basic characters of these materials bring on difficulty on the application of the secondary ion mass spectrometry (SIMS) for the chemical analysis of these materials. In this study, we have developed experimental and theoretical techniques for the precise quantitative analysis of the trace elements with small atomic number, such as hydrogen, boron, oxygen etc., in minerals and rocks using a SIMS (CAMECA 3f type), and the following studies have been carried out using the above new techniques.(1) Anion and cation partitioning coefficients between phenocrysts (pyroxenes, plagioclase, chrome spinel) and host magma were measured.(2) Development of techniques for the quantitative analysis of insulated materials by a simple working curve method was carried out using SIMS.(3) Analysis of the distribution of boron in the diamond substrate synthesized by plasma CVD was studied using the depth profiles by SIMS.(4) A new analytical method of dislocation pipe radius using combined equivalent boundary slab model and dislocation pipe model was developed based on the diffusion profile data measured by SIMS.(5) Quantitative micro analysis of hydrogen in quartz and quartz glasses (minimum detection limit : lppm) were developed using SIMS.(6) Diffusion profiles of ^<18>O tracer in single crystals of melilites were measured by SIMS, and were analysed in terms of diffusion in the melilite lattice together with a contribution from dislocations.(7) Quantitative micro analysis of the trace elements in the standard rock specimens were developed using SIMS.(8) Simultaneous measuring method of lattice and dislocation diffusion coefficients in MgO was developed and this method made possible to obtain two coefficients separately from one experimental run.

大多数矿物和岩石都是绝缘体，其化学成分相当复杂。这些材料的这些基本特征给应用二次离子质谱（SIMS）进行这些材料的化学分析带来了困难。本研究开发了利用SIMS（CAMECA 3f型）对矿物和岩石中氢、硼、氧等小原子序数元素进行精确定量分析的实验和理论技术，并利用上述新技术开展了以下研究。（1）斑晶（辉石、辉石、 (2)利用SIMS开发了简单工作曲线法定量分析绝缘材料的技术。(3)利用SIMS深度剖面研究了等离子体CVD合成金刚石基体中硼的分布。(4)基于组合等效边界板的位错管半径分析新方法基于SIMS测量的扩散剖面数据建立了模型和位错管模型。(5)利用SIMS开发了石英和石英玻璃中氢的定量微量分析(最低检测限：lppm)。(6)利用SIMS测量了黄长石单晶中^<18>O示踪剂的扩散剖面，并根据在黄长石晶格中的扩散以及贡献进行了分析。 (7)利用SIMS开发了标准岩石样品中微量元素的定量微分析。(8)开发了MgO中晶格和位错扩散系数的同时测量方法，该方法使得可以在一次实验中分别获得两个系数。