A study on the distribution and behavior of light elements in minerals and rocks

大多数矿物和岩石都是绝缘体，它们的化学成分相当复杂。这些材料的基本特性给二次离子质谱法（SIMS）在化学分析中的应用带来了困难。在本研究中，我们开发了利用SIMS （CAMECA 3f型）对矿物和岩石中氢、硼、氧等原子序数小的微量元素进行精确定量分析的实验和理论技术，并利用上述新技术进行了以下研究。(1)测定了斑晶（辉石、斜长石、铬尖晶石）与寄主岩浆之间的阴离子和阳离子分配系数。(2)利用SIMS进行了简单工作曲线法对绝缘材料进行定量分析的技术开发。(3)利用SIMS深度剖面分析了等离子体CVD合成的金刚石衬底中硼的分布。(4)基于SIMS测量的扩散剖面数据，提出了一种利用等效边界板模型和位错管模型相结合的位错管半径分析方法。(5)采用SIMS对石英和石英玻璃中的氢进行了微量定量分析（最低检出限为lppm）。(6)用SIMS测量了^<18>示踪剂在千粒石单晶中的扩散曲线，并根据千粒石晶格中的扩散以及位错的贡献进行了分析。(7)采用SIMS对标准岩样中微量元素进行了定量微观分析。(8)提出了同时测量MgO晶格扩散系数和位错扩散系数的方法，该方法可以在一次实验中分别获得两个系数。

The most of minerals and rocks are insulator and they have quite complicated chemical compositions. These basic characters of these materials bring on difficulty on the application of the secondary ion mass spectrometry (SIMS) for the chemical analysis of these materials. In this study, we have developed experimental and theoretical techniques for the precise quantitative analysis of the trace elements with small atomic number, such as hydrogen, boron, oxygen etc., in minerals and rocks using a SIMS (CAMECA 3f type), and the following studies have been carried out using the above new techniques.(1) Anion and cation partitioning coefficients between phenocrysts (pyroxenes, plagioclase, chrome spinel) and host magma were measured.(2) Development of techniques for the quantitative analysis of insulated materials by a simple working curve method was carried out using SIMS.(3) Analysis of the distribution of boron in the diamond substrate synthesized by plasma CVD was studied using the depth profiles by SIMS.(4) A new analytical method of dislocation pipe radius using combined equivalent boundary slab model and dislocation pipe model was developed based on the diffusion profile data measured by SIMS.(5) Quantitative micro analysis of hydrogen in quartz and quartz glasses (minimum detection limit : lppm) were developed using SIMS.(6) Diffusion profiles of ^<18>O tracer in single crystals of melilites were measured by SIMS, and were analysed in terms of diffusion in the melilite lattice together with a contribution from dislocations.(7) Quantitative micro analysis of the trace elements in the standard rock specimens were developed using SIMS.(8) Simultaneous measuring method of lattice and dislocation diffusion coefficients in MgO was developed and this method made possible to obtain two coefficients separately from one experimental run.