A study on the distribution and behavior of light elements in minerals and rocks

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The most of minerals and rocks are insulator and they have quite complicated chemical compositions. These basic characters of these materials bring on difficulty on the application of the secondary ion mass spectrometry (SIMS) for the chemical analysis of these materials. In this study, we have developed experimental and theoretical techniques for the precise quantitative analysis of the trace elements with small atomic number, such as hydrogen, boron, oxygen etc., in minerals and rocks using a SIMS (CAMECA 3f type), and the following studies have been carried out using the above new techniques.(1) Anion and cation partitioning coefficients between phenocrysts (pyroxenes, plagioclase, chrome spinel) and host magma were measured.(2) Development of techniques for the quantitative analysis of insulated materials by a simple working curve method was carried out using SIMS.(3) Analysis of the distribution of boron in the diamond substrate synthesized by plasma CVD was studied using the depth profiles by SIMS.(4) A new analytical method of dislocation pipe radius using combined equivalent boundary slab model and dislocation pipe model was developed based on the diffusion profile data measured by SIMS.(5) Quantitative micro analysis of hydrogen in quartz and quartz glasses (minimum detection limit : lppm) were developed using SIMS.(6) Diffusion profiles of ^<18>O tracer in single crystals of melilites were measured by SIMS, and were analysed in terms of diffusion in the melilite lattice together with a contribution from dislocations.(7) Quantitative micro analysis of the trace elements in the standard rock specimens were developed using SIMS.(8) Simultaneous measuring method of lattice and dislocation diffusion coefficients in MgO was developed and this method made possible to obtain two coefficients separately from one experimental run.