Substrate surface modification by ion beam irradiation-Deposition of a polycrystalline silicon at a low temperature-
通过离子束照射进行的基板表面改性-多晶硅的低温沉积-
基本信息
- 批准号:07555040
- 负责人:
- 金额:$ 3.01万
- 依托单位:
- 依托单位国家:日本
- 项目类别:Grant-in-Aid for Scientific Research (B)
- 财政年份:1995
- 资助国家:日本
- 起止时间:1995 至 1996
- 项目状态:已结题
- 来源:
- 关键词:
项目摘要
This study aims at improving surface physical properties by ion beam irradiation for controlling the film growth processes. The following are the results.1) The apparatus for substrate surface modification with ion gun was constructed, combining the ion gun with the high vacuum chamber. And mass separation system located between the ion gun and high vacuum chamber was found to have enough resolutions.2) To realize low temperature deposition of a polycrystalline silicon thin film on amorphous substrate, improving surface physical properties by silicon ion beam irradiation was adapted to the glass surface. Then, crystallized nuclees was found to be created on the glass surface at room temperature.3) On the glass surface covered with crystallized nuclees after the above process, polycrystalline silicon thin film was obtained at below 260゚C by E.B.vacuum evaporation of silicon. In this way, low temperature (below 260゚C) deposition of polycrystalline silicon thin film on amorphous substrate was realized with improving surface physical properties by ion beam irradiation.
本研究旨在借由离子束照射改善薄膜表面物理性质,以控制薄膜成长过程。主要研究结果如下:1)将离子枪与高真空室相结合,构建了离子枪基片表面改性装置。在离子枪和高真空室之间的质量分离系统具有足够的分辨率。2)为了实现在非晶衬底上低温沉积多晶硅薄膜,采用硅离子束辐照改善玻璃表面的物理性能。然后,发现在室温下在玻璃表面上产生结晶核。3)在上述过程之后覆盖有结晶核的玻璃表面上,通过硅的E.B.真空蒸发在低于260 ℃下获得多晶硅薄膜。通过离子束辐照,实现了在非晶衬底上低温(低于260 ℃)沉积多晶硅薄膜,改善了薄膜表面的物理性能。
项目成果
期刊论文数量(0)
专著数量(0)
科研奖励数量(0)
会议论文数量(0)
专利数量(0)
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YAMAUCHI Kazuto其他文献
YAMAUCHI Kazuto的其他文献
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{{ truncateString('YAMAUCHI Kazuto', 18)}}的其他基金
Sub-10nm hard X-ray focusing and application to nanoscopy/spectroscopy
亚10nm硬X射线聚焦及其在纳米显微镜/光谱学中的应用
- 批准号:
18002009 - 财政年份:2006
- 资助金额:
$ 3.01万 - 项目类别:
Grant-in-Aid for Specially Promoted Research
A high sensitive evalution method for Si surface crystallografic properties by employing surface photovoltage effects.
一种利用表面光电压效应评价硅表面晶形特性的高灵敏度方法。
- 批准号:
06650143 - 财政年份:1994
- 资助金额:
$ 3.01万 - 项目类别:
Grant-in-Aid for General Scientific Research (C)
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