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Development of In-Process Ultrasonic Measurement For Quality Assurance of Microjoints in Electronic Devices

Development of In-Process Ultrasonic Measurement For Quality Assurance of Microjoints in Electronic Devices
用于电子设备微接头质量保证的过程中超声波测量的开发
批准号:
07650148
负责人:
SATONAKA Shinobu
金额:
$1.41万
依托单位:
依托单位国家:
日本
项目类别:
Grant-in-Aid for Scientific Research (C)
财政年份:
1995
资助国家:
日本
项目状态:
已结题
起止时间:
1995 至 1996

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中文摘要
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英文摘要
In the assembly process of electronic devices, many bonding techniques are applied to the small area or thin layr, in which poor bonding may result in electrical failures. Therefore, in-line or in-process testing of micro bonded area are demanded for the quality assurance of electronic devices. However, there are few techniques applicable to the micro bonded area. In this study, two methods are proposed for the non-destructive evaluation of small or thin bonded area in the microcircuit. First method is the ultrasonic testing of wire bonded area with a delay line. Another one is the ultrasonic testing of die bonding with a focused probe. The results obtained are as follows.1.Ultrasonic testing of wire bonding with a delay lineAn ultrasonic testing with delay line is proposed, in which a bonding tool or capillary is used for the delay line and is connected to the probe. In this method, the reflected wave through the capillary indicates proportional amplitude change to the fracture load i … More n the push test. Since the fracture load corresponds to the wire bonding state, this method enables the non-destructive evaluation of wire bonding. Although the reflected wave depends upon the measuring pressure, contact of capillary with probe and couplant, the same condition of measuring pressure to bonding process suggests that this method is applicable to the in-process measurement of wire bonding.2.Ultrasonic testing of die bonding with a focused probeA newly developed ultrasonic testing with a focused probe is applied to the die bonded area, where the paste is supplied in the thin layr between 0.15 mm thick substrate and 0.29 mm thick microcircuit. Under the measuring condition of shorter water path than the focal length of ultrasonic beam, the interface echo reflected from the interface between the substrate and paste is detected with an observable time delay behind surface echo. The interface echo in the scanning indicates the corresponding amplitude change to the lack of paste as well as the debonding. The measurement in the volatile liquid prevents the microcircuit from the corrosion and absorption of water, and shows the same results in the water. The ultrasonic testing in the volatile liquid is available to the in-line measurement of micro devices. Less
期刊论文(3)
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会议论文
里中 忍: "集束探触子を利用したダイボンディング部の超音波探傷" 日本機械学会第4回機械材料・材料加工技術講演会講演論文集. 121-122 (1996)
Shinobu Satonaka:“使用聚焦探头对芯片接合部件进行超声波探伤”日本机械工程学会第四届机械材料和材料加工技术会议论文集 121-122(1996)。
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作者: []
通讯作者:
Shinobu SATONAKA: "Ultrasonic Examination of Die Bonded Joint in Semiconductor with a Focused Probe" The 4th Materials and Processing Conference (M & P'96). 121-122 (1996)
Shinobu SATONAKA:“使用聚焦探头对半导体芯片粘合接头进行超声波检查”第四届材料与加工会议(M)
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Optimum Design of Spot Weld Joints and Nondestructive Measurement of Weld Quality for Light Weight Structures
  • 批准号:
    11650133
  • 项目类别:
    Grant-in-Aid for Scientific Research (C)
  • 资助金额:
    $2.11万
  • 财政年份:
    1999
  • 负责人:
    SATONAKA Shinobu
  • 依托单位:
System Development for In-Line and In-Process Measurement of Spot Weld Quality with Optical Measurement
  • 批准号:
    07555526
  • 项目类别:
    Grant-in-Aid for Scientific Research (A)
  • 资助金额:
    $2.94万
  • 财政年份:
    1995
  • 负责人:
    SATONAKA Shinobu
  • 依托单位:
海外基金