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Study of Arc Quenching Properties of SF_6 by Induction Thermal Plasma

感应热等离子体SF_6灭弧性能研究

基本信息

批准号：
08650332
负责人：
SAKUTA Tadahiro
金额：
$ 1.34万
依托单位：
Kanazawa University
依托单位国家：
日本
项目类别：
Grant-in-Aid for Scientific Research (C)
财政年份：
1996
资助国家：
日本
起止时间：
1996 至 1997
项目状态：
已结题

来源：
https://kaken.nii.ac.jp/grant/KAKENHI-PROJECT-08650332/
关键词：
SF6 N_2 Induction Plasma Circuit Breaker Electrode Vapor Electron Affinity Pinch Thermal Conductivity SF_6 N_2 誘導プラズマ遮断プラズマ・ピンチ熱伝導率

项目摘要

The research is mainly devoted to develop a standard test device to investigate the arc quenching properties of SF6 gas and the influence of electrode and nozzle material vapors on it. A fundamental feature of the device is that the induction plasma is used as a main plasma source, which enable us to generate a clean and high temperature plasma medium in any kinds of gases at high pressure conditions like in circuit breakers. In the final year of the program, 1997, special attention was paid on the important effects of electron attachment, that is, decrease of the electron unmber density as well as the decrease of electron energy. The N2 gas properties was also investigated as a future quenching medium family with the earth circumstance by this plasma technique. Main results obtained are as follows ;1) Generation of High Pressure SF6 Induction Plasma Although until the previous year, the pressure of the plasma is limited to 200 torr soft vacuum condition, A high-pressure 760 torr induction SF6 plasma was firstly generated in stable mode, which give the more reliable conditions close to those occurring in circuit breakers. N2 induction plasma was also recognized to be generated at such high pressure.2) Measurement of Plasma Temperature Spectroscopic measurement with atomic spectra from S,F,and Ar revealed that the induction plasmas are in high temperature of around 10,000 K.However, SF6 gas shows a remarkable properties of quenching of the plasma radius due to its high thermal conductivity and electron attachment effect compared to N2 gas.3) Effect of Cu Vapor Contamination By using the plasma technique, the effects of 1-% Cu vapor contamination were studied quantitatively and this increases the electron density and thus the radius of the induction plama, which will result in a reduction of the current interruption performance.

本研究主要致力于研制一种用于研究SF6气体灭弧特性以及电极和喷嘴材料蒸气对其影响的标准试验装置，该装置的一个基本特点是采用感应等离子体作为主要等离子体源，使我们能够在高压条件下在任何气体中产生洁净的高温等离子体介质，就像断路器中一样。在该计划的最后一年，1997年，特别注意到电子附着的重要影响，即电子数密度的降低以及电子能量的降低。并利用该等离子体技术研究了作为未来淬火介质族的N2气体在地球环境下的特性。1）高压SF6感应等离子体的产生虽然直到去年，等离子体的压力被限制在200 μ m的软真空条件下，但首次在稳定模式下产生了高压760 μ m的感应SF6等离子体，这给出了接近断路器中发生的那些的更可靠的条件。N2感应等离子体也被认为是在如此高的压力下产生的。2）等离子体温度的测量用来自S、F和Ar的原子光谱进行的光谱测量揭示了感应等离子体处于约10，000 K的高温。然而，与N2气体相比，SF6气体由于其高的热导率和电子附着效应而显示出显著的等离子体半径猝灭特性。Cu蒸气污染的影响通过使用等离子体技术，定量地研究了1% Cu蒸气污染的影响，这增加了电子密度，从而增加了感应等离子体的半径，这将导致电流中断性能的降低。