Micro-tribological study of metal surfaces using scanning probe microscope

使用扫描探针显微镜对金属表面进行微观摩擦学研究

基本信息

  • 批准号:
    08650856
  • 负责人:
  • 金额:
    $ 1.34万
  • 依托单位:
  • 依托单位国家:
    日本
  • 项目类别:
    Grant-in-Aid for Scientific Research (C)
  • 财政年份:
    1996
  • 资助国家:
    日本
  • 起止时间:
    1996 至 1997
  • 项目状态:
    已结题

项目摘要

Micro-tribological studies are made using a scanning probe microscope (SPM) which can measure the lateral force as well as the normal force images. The SPM is placed in an atmosphere control apparatus and the relative humidity around the tip-sample is controlled from 30% to 70%. Measurements are also performed in a high purity water bath. Samples investigated are the cleaved surfaces of mica, HOPG and MoS_2, and the polished metal surfaces of Ni, Cu and Al. In order to discuss the micro-tribological effects of adsorbed water molecules and the capillary condensation of water, the lateral force images are examined quantitatively as a function of the normal load on the sample surface. For surfaces of mica, HOPG and MoS_2, lateral force images with the lattice periodicity are obtained in the same manner as atomic scale topography images. The dependence of lateral force magnitude on the normal force is found to be affected by the atmosphere around the tip and the sample. At low relative humidity, 30%, the lateral force magnitude in atomic scale imaging is almost independent of the normal load. At high relative humidity, 70%, the lateral force magnitude exhibits dependence on the normal load. In water, the lateral force magnitude is approximately in proportion to the normal load. For surfaces of metal almost same behavior is obtained in the average value of lateral force. We conclude that the adhesive force due to the presence of water has severe influence upon the lateral force. From discussion on the viewpoints of Hertz analysis, Elasto-Hydrodynamic Lubrication and capillary condensation of water, the contact mechanism of the tip-sample is revealed.
微观摩擦学研究是使用扫描探针显微镜 (SPM) 进行的,它可以测量横向力以及法向力图像。 SPM 放置在气氛控制装置中,尖端样品周围的相对湿度控制在 30% 至 70% 之间。测量也在高纯度水浴中进行。研究的样品是云母、HOPG和MoS_2的劈裂表面,以及Ni、Cu和Al的抛光金属表面。为了讨论吸附水分子和水的毛细管冷凝的微观摩擦学效应,定量检查侧向力图像作为样品表面法向载荷的函数。对于云母、HOPG和MoS_2的表面,以与原子尺度形貌图像相同的方式获得具有晶格周期性的侧向力图像。发现侧向力大小对法向力的依赖性受到尖端和样品周围气氛的影响。在相对湿度较低(30%)的情况下,原子尺度成像中的横向力大小几乎与法向载荷无关。在高相对湿度(70%)下,侧向力大小表现出对法向载荷的依赖性。在水中,侧向力的大小大约与法向载荷成正比。对于金属表面,在侧向力的平均值中获得几乎相同的行为。我们得出的结论是,由于水的存在而产生的粘合力对侧向力有严重影响。从赫兹分析、弹性流体动力润滑和水的毛细管凝结的角度进行讨论,揭示了尖端与样品的接触机理。

项目成果

期刊论文数量(22)
专著数量(0)
科研奖励数量(0)
会议论文数量(0)
专利数量(0)
T.Sumomogi, H.Sakai, M,Nakata and T.Endo: "Nanoscale evaluation of surface roughness of metal films prepared by laser ablation" Appl.Phys.A. 66(in press). (1998)
T.Sumomogi、H.Sakai、M、Nakata 和 T.Endo:“激光烧蚀制备的金属薄膜表面粗糙度的纳米级评估”Appl.Phys.A。
  • DOI:
  • 发表时间:
  • 期刊:
  • 影响因子:
    0
  • 作者:
  • 通讯作者:
M. Yasuda et al: "Correction of surface roughness in nano-scalemeasurements with scanning probe microscope" Mem. Hiroshima-Denki Inst. & Hiroshima Jun. Col. Auto. Engi.,. 30. 47-54 (1997)
M. Yasuda 等人:“用扫描探针显微镜校正纳米级测量中的表面粗糙度”Mem。
  • DOI:
  • 发表时间:
  • 期刊:
  • 影响因子:
    0
  • 作者:
  • 通讯作者:
T.Endo et al: "Preparation of Matallic Nanocluster on Graphite by Laser Ablation in STM/STS Apparatus at Low Temperatures" 9th Int'l Conf. on STM/STS,July 20-25,1997,Hamburg,Germany. (Program No Th12.2P05). (1997)
T.Endo 等人:“低温下在 STM/STS 装置中通过激光烧蚀在石墨上制备金属纳米团簇”第 9 届国际会议。
  • DOI:
  • 发表时间:
  • 期刊:
  • 影响因子:
    0
  • 作者:
  • 通讯作者:
M.Yasuda, T.Saiki and T.Sumomogi: "Correction of surface roughness in nano-scale measurements with scanning probe microscope" Mem.Hiroshima-Denki Inst.& Hiroshima Jun.Col.Auto.Enji.30. 47 (1997)
M.Yasuda、T.Saiki 和 T.Sumomogi:“使用扫描探针显微镜校正纳米级测量中的表面粗糙度”Mem.Hiroshima-Denki Inst。
  • DOI:
  • 发表时间:
  • 期刊:
  • 影响因子:
    0
  • 作者:
  • 通讯作者:
T.Sumomogi et al: "Influence of atmosphere on tribological properties of scanning probe microscope observation" 4th Int'l Conf.on Nanometer-scale Sci. & Technol. September 8-12,1996,Beijing,China,. Program No.18-Wep48 (1996)
T.Sumomogi 等人:“大气对扫描探针显微镜观察的摩擦学特性的影响”第四届纳米尺度科学国际会议。
  • DOI:
  • 发表时间:
  • 期刊:
  • 影响因子:
    0
  • 作者:
  • 通讯作者:
{{ item.title }}
{{ item.translation_title }}
  • DOI:
    {{ item.doi }}
  • 发表时间:
    {{ item.publish_year }}
  • 期刊:
  • 影响因子:
    {{ item.factor }}
  • 作者:
    {{ item.authors }}
  • 通讯作者:
    {{ item.author }}

数据更新时间:{{ journalArticles.updateTime }}

{{ item.title }}
  • 作者:
    {{ item.author }}

数据更新时间:{{ monograph.updateTime }}

{{ item.title }}
  • 作者:
    {{ item.author }}

数据更新时间:{{ sciAawards.updateTime }}

{{ item.title }}
  • 作者:
    {{ item.author }}

数据更新时间:{{ conferencePapers.updateTime }}

{{ item.title }}
  • 作者:
    {{ item.author }}

数据更新时间:{{ patent.updateTime }}

SUMOMOGI Tsunetaka其他文献

SUMOMOGI Tsunetaka的其他文献

{{ item.title }}
{{ item.translation_title }}
  • DOI:
    {{ item.doi }}
  • 发表时间:
    {{ item.publish_year }}
  • 期刊:
  • 影响因子:
    {{ item.factor }}
  • 作者:
    {{ item.authors }}
  • 通讯作者:
    {{ item.author }}

{{ truncateString('SUMOMOGI Tsunetaka', 18)}}的其他基金

High Efficient and High Quality Machining of Optical Glass by Ductile Mode Grinding
延性模式磨削光学玻璃的高效、高质量加工
  • 批准号:
    13650788
  • 财政年份:
    2001
  • 资助金额:
    $ 1.34万
  • 项目类别:
    Grant-in-Aid for Scientific Research (C)
Investigation of ductile-to-brittle transitions on ultra-precision machining of single crystal silicon
单晶硅超精密加工中的韧脆转变研究
  • 批准号:
    11650753
  • 财政年份:
    1999
  • 资助金额:
    $ 1.34万
  • 项目类别:
    Grant-in-Aid for Scientific Research (C)
Micro-machining of metal surfaces by scanning probe microscope
通过扫描探针显微镜对金属表面进行微加工
  • 批准号:
    06650821
  • 财政年份:
    1994
  • 资助金额:
    $ 1.34万
  • 项目类别:
    Grant-in-Aid for General Scientific Research (C)

相似海外基金

High-Speed Atomic Force Microscope
高速原子力显微镜
  • 批准号:
    532150447
  • 财政年份:
    2024
  • 资助金额:
    $ 1.34万
  • 项目类别:
    Major Research Instrumentation
Bruker Atomic Force Microscope NanoWizard® 5
布鲁克原子力显微镜 NanoWizard® 5
  • 批准号:
    10632932
  • 财政年份:
    2023
  • 资助金额:
    $ 1.34万
  • 项目类别:
high resolution structural characterization of extraterrestrial polyaromatic hydrocarbon by atomic force microscope
原子力显微镜高分辨率地外多芳烃结构表征
  • 批准号:
    23K13665
  • 财政年份:
    2023
  • 资助金额:
    $ 1.34万
  • 项目类别:
    Grant-in-Aid for Early-Career Scientists
Atomic force microscope and -spectroscope with bio-measurement head
带生物测量头的原子力显微镜和光谱仪
  • 批准号:
    519828155
  • 财政年份:
    2023
  • 资助金额:
    $ 1.34万
  • 项目类别:
    Major Research Instrumentation
Atomic force microscope
原子力显微镜
  • 批准号:
    503206463
  • 财政年份:
    2023
  • 资助金额:
    $ 1.34万
  • 项目类别:
    Major Research Instrumentation
Atomic force microscope for high-speed, nanomechanical and electrochemical characterizations
用于高速、纳米力学和电化学表征的原子力显微镜
  • 批准号:
    529852963
  • 财政年份:
    2023
  • 资助金额:
    $ 1.34万
  • 项目类别:
    Major Research Instrumentation
Atomic Force Microscope for Materials Characterization
用于材料表征的原子力显微镜
  • 批准号:
    RTI-2023-00045
  • 财政年份:
    2022
  • 资助金额:
    $ 1.34万
  • 项目类别:
    Research Tools and Instruments
Low temperature ultrahigh vacuum scanning tunneling/ atomic force microscope with tuning fork sensor
带音叉传感器的低温超高真空扫描隧道/原子力显微镜
  • 批准号:
    493870016
  • 财政年份:
    2022
  • 资助金额:
    $ 1.34万
  • 项目类别:
    Major Research Instrumentation
Atomic Force Microscope
原子力显微镜
  • 批准号:
    492390964
  • 财政年份:
    2022
  • 资助金额:
    $ 1.34万
  • 项目类别:
    Major Research Instrumentation
MRI: Acquisition of a High-Resolution Atomic Force Microscope at Montclair State University
MRI:在蒙特克莱尔州立大学购买高分辨率原子力显微镜
  • 批准号:
    2215861
  • 财政年份:
    2022
  • 资助金额:
    $ 1.34万
  • 项目类别:
    Standard Grant
{{ showInfoDetail.title }}

作者:{{ showInfoDetail.author }}

知道了