New development of compact tensile tester with scanning probe microscope for micro-scale specimen
New development of compact tensile tester with scanning probe microscope for micro-scale specimen
批准号:
11650107
负责人:
TANAKA Takeshi
金额:
$2.24万
依托单位:
依托单位国家:
日本
项目类别:
Grant-in-Aid for Scientific Research (C)
财政年份:
1999
资助国家:
日本
项目状态:
已结题
起止时间:
1999 至 2000
中文摘要
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英文摘要
This research describes a micro-scale tensile test with a scanning probe microscope (SPM) for micro-scale materials used in electronic and MEMS devices. Three kinds of materials, which are single crystal silicon (Si), diamond like carbon and permalloy thin films, was used here. The film specimens were fabricated by a micro machining process technique. A compact tensile tester including a smaller sized piezoelectric actuator was also newly developed, and the tester was built in the SPM.It has been so far difficult to measure strain of micro-scale specimen during a tensile test because of the shorter gage length of specimen. In this research, the SPM was used as an extensometer of micro-scale specimens with a resolution on the order of 1 nanometer, so that strain was obtained in the course of tests.Young's modulus of micro-scale Si specimen measured by the SPM ranged from 157 GPa to 166 GPa, which was similar to that of millimeter scale Si. Furthermore, the Young's modulus of Si recalculated by fitting the SPM data to a spline function showed 170 GPa, which was in agreement with that of bulk sized Si in [110] direction. The micro-scale specimen produced an increase of the tensile strength since the strength of micro-scale Si specimen showed 0.9-1.2 GPa that was 2-3 times larger than that of bulk sized Si. Scanning electron microscopic observations also revealed micro-scale Si specimen fractured brittle manner in room temperature. So, the specimen size effect on tensile strength would have been caused by a reduction of the number of cracks in specimen with decreasing the specimen size.This research also carried out tensile tests of DLC and permalloy thin films deposited on the micro-scale Si specimen. However, an accurate stress-strain curve of DLC and permalloy films was not obtained since the film specimen did not fractured at the gage part of specimen. Further experiments are needed to reveal mechanical properties of DLC and permalloy films.
期刊论文(2)
专著(0)
科研奖励(0)
会议论文
Takahiro Namazu, Yoshitada Isono and Takeshi Tanaka: "Evaluation of Size Effect on Mechanical Properties of Single Crystal Silicon by Nano-Scale Bending Test using AFM"Journal of Micro Electro Mechanical Systems, IEEE. Vol.9,No.4. 450-459 (2000)
Takahiro Namazu、Yoshitada Isono 和 Takeshi Tanaka:“使用 AFM 进行纳米级弯曲测试来评估单晶硅机械性能的尺寸效应”微机电系统杂志,IEEE。
DOI:
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发表时间:
期刊:
影响因子:
--
作者:
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通讯作者:
Takahiro Namazu, Yoshitada Isono and Takeshi Tanaka: "Evaluation of Size Effect on Mechanical Properties of Single Crystal Silicon by Nano-Scale Bending Test using AFM"Journal of MEMS, IEEE. Vol.9, No.4. 450-459 (2000)
Takahiro Namazu、Yoshitada Isono 和 Takeshi Tanaka:“使用 AFM 进行纳米级弯曲测试来评估单晶硅机械性能的尺寸效应”Journal of MEMS、IEEE。
DOI:
--
发表时间:
期刊:
影响因子:
--
作者:
[]
通讯作者:
Analysis of protective mechanism of acute lung injury via serotonin transporter/serotonin blockade
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批准号:16K09544
-
项目类别:Grant-in-Aid for Scientific Research (C)
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资助金额:$3.0万
-
财政年份:2016
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负责人:TANAKA Takeshi
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依托单位:
Definition of standard requirements for medical institution webpage that guarantees web accessibility of visually impaired person
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批准号:15K00438
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项目类别:Grant-in-Aid for Scientific Research (C)
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资助金额:$3.0万
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财政年份:2015
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负责人:TANAKA Takeshi
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依托单位:
Single structure separation of metallic carbon nanotubes using gel
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批准号:23651122
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项目类别:Grant-in-Aid for Challenging Exploratory Research
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财政年份:2011
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依托单位:
Elucidation of separation mechanism of metallic and semiconducting carbon nanotubes using gel
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批准号:21681016
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项目类别:Grant-in-Aid for Young Scientists (A)
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资助金额:$17.14万
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财政年份:2009
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负责人:TANAKA Takeshi
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依托单位:
環境対応型研削加工における有気孔ホイール/砥石の気孔有用性の理論的・実験的解明
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批准号:14550113
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项目类别:Grant-in-Aid for Scientific Research (C)
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资助金额:$2.18万
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财政年份:2002
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负责人:TANAKA Takeshi
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依托单位:
海外基金