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Negative-resistance device having multi-barrier structures using low molecule-dye-doped polymer

Negative-resistance device having multi-barrier structures using low molecule-dye-doped polymer
使用低分子染料掺杂聚合物的具有多势垒结构的负电阻器件
批准号:
11650364
负责人:
KAWAMOTO Akira
金额:
$1.66万
依托单位国家:
日本
项目类别:
Grant-in-Aid for Scientific Research (C)
财政年份:
1999
资助国家:
日本
项目状态:
已结题
起止时间:
1999 至 2001

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中文摘要
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英文摘要
Possible models for the origin of negative-resistance in negative-resistance device having multi-barrier structures using low molecule-dye-doped polymer are as follows. One is the interface-tunneling model- based on the tunneling between electrode and dye molecules. Another model is bulk-dominant model-based on the intermolecular tunneling. In this paper, the origin of the negative-resistance was discussed, on the basis of possible models and the UV irradiative effect on polymer-matrices.The interface-tunneling model was studied with model sample (anode/insulating layer/dye molecular layer/cathode).The results are summarized as follows. The peak current decrease, but peak voltage increases as the tunneling barrier width increases. The peak to valley (p/v) ratio decreases as the tunneling barrier is lowered. The peak current decreases as the well width increase.On the other hand, the bulk dominant model was studied using Energy Filter Traverse Electron Microscope (EFTEM). In order to cl … More arify the dispersed state of dye molecules in polymer, the element mapping in bulk was observed using EFTEM from direction across the interface between electrode and bulk. The results are as follows.Clusters were formed by the electron or hole transporting dyes in bulk. Each clusters were 2〜25 nm distance, short distance that enable carriers to tunnel. This suggests that conductive path is not formed in between clusters and EFTEM is an effective method to estimate a state of low molecule dispersed in polymer.The Fermi level of PVK became higher with UV irradiation. This change is considered to be due to the formation of trap level due to oxidation. The density of states in valence band increases with UV irradiation. The Fermi level of PVK and PVP became lower with heat treatment in vacuum.These suggest that electron or hole tunnel intermolecular of dyes in bulk, but the insulating layer at electrode interface dominates the negative-resistance characteristics and electronic states of polymers are changed by UV irradiation. It seems that this study contributed to the solution of the mechanism of the negative-resistance in negative-resistance device. Less
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川 本 昂: "有機薄膜を用いた負性抵抗素子-界面絶縁層が負性抵抗特性に及ぼす効果と色素分子の分散状態-"誘電・絶縁材料研究会. DEI-01-110. 37-42 (2001)
Ko Kawamoto:“使用有机薄膜的负电阻元件 - 界面绝缘层对负电阻特性和染料分子分散状态的影响 -”介电和绝缘材料研究组。
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川本昴: "高分子負性抵抗素子の負性抵抗発現機構に関する研究-電子分光によるPVK薄膜中の色素分子の分布状態観察"平成11年度電気関係学会北陸支部連合大会. 217 (1999)
河本昴:“聚合物负阻元件中负阻发展机制的研究-通过电子光谱观察PVK薄膜中染料分子的分布状态”1999年日本电气工程师联合会北陆分会217(1999)。
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川本昂: "界面絶縁層が負性抵抗特性に及ぼす効果"平成13年度電気学会全国大会. 2-114 (2001)
Ko Kawamoto:“界面绝缘层对负电阻特性的影响”2001年日本电气工程师学会全国会议2-114(2001)。
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川本昴: "分子分散ポリマー型負性抵抗素子薄膜における低分子材料の分散性のEFTEM観察"日本電子顕微鏡学会 電子分光結像法研究部会平成11年度 第1回研究会・ワークショップ. 24 (1999)
Subaru Kawamoto:“分子分散聚合物型负电阻元件薄膜中低分子材料分散的EFTEM观察”日本电子显微镜学会电子光谱成像研究小组委员会,1999年第1次研究会议/研讨会(1999)。
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16
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    • 资助金额:
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      1993
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