Development of X-ray ellipsometer and its application

X射线椭偏仪的研制及其应用

基本信息

批准号：
12355005
负责人：
AMEMIYA Yoshiyuki
金额：
$ 13.27万
依托单位：
The University of Tokyo
依托单位国家：
日本
项目类别：
Grant-in-Aid for Scientific Research (A)
财政年份：
2000
资助国家：
日本
起止时间：
2000 至 2001
项目状态：
已结题

来源：
https://kaken.nii.ac.jp/grant/KAKENHI-PROJECT-12355005/
关键词：
X-ray polarization synchrotron radiation phase retarder ellipsometer optical activity X-ray polarizing microscope X-ray optics 偏光顕微鏡シンクロトロン放射 X線エリプソメーター X線移相子 X線位相子

项目摘要

The method of ellipsometry in the visible-light range has been widely used in many applications. However, the ellipsometry in X-ray spectral range is still unprecedented because until recently the polarization-sensitive optics of good quality was not available. Recently, the polarization-sensitive optical elements (polarizer, analyzer and phase retarder) for X-rays have been developed by several groups including ours. If these optical elements are combined carefully for use with highly polarized synchrotron radiation X-rays, the ellipsometry for the X-ray region should be possible.In this study, we have developed an X-ray elipsometer by combining a rotatable four-quadrant diamond phase-retarder system (consisting of four sets of diamond thin crystals) which we developed and an X-ray polarimeter (consisting of an X-ray polarizer and an X-ray analyzer). With this apparatus, we have successfully created well-defined arbitrary polarization states of X-rays and analyzed the polarization states of X-rays which transmitted the sample with high precision. Then, we have measured circular birefringence (CB) and circular dichroism (CD) precisely for arbitrary symmetry of crystal samples by introducing two-dimensional scans (rotations of the analyzer and the polarizer). We have successfully obtained four optical parameters (birefringence (LB), linear dichroism (LD), circular birefringence (CB) and circular dichroism (CD)) of the non-optic axis of the Co(en)_3BrH_2O single crystal which has a uni-axis by applying a high-precision polarization switching.This apparatus will be applied to studies of anisotropy of structures and electronic state of materials.

可见光范围内的椭圆法的方法已在许多应用中广泛使用。但是，X射线光谱范围内的椭圆法仍然是前所未有的，因为直到最近，还没有质量质量的极化敏感光学。最近，包括我们在内的几个组开发了对X射线的偏振敏感的光学元件（偏振器，分析仪和相位延迟）。如果将这些光学元件仔细合并与高度极化的同步辐射X射线射线，则应进行X射线区域的椭圆法，这是可能的。在这项研究中，我们通过结合可旋转的四季度钻石钻石相位驱动器系统（由X-Reply and X-Rymonders组成）（由X-Ray x-Rays组成的四组x-Ray s-Ray sare x rays（ray）（ray x ray x ray sare x ro.分析仪）。使用该设备，我们成功地创建了X射线的定义明确的任意极化状态，并分析了X射线的极化状态，这些状态以高精度传输了样品。然后，我们通过引入二维扫描（分析仪和偏振器的旋转），精确地测量了循环双折射（CB）和圆形二色性（CD）。 We have successfully obtained four optical parameters (birefringence (LB), linear dichroism (LD), circular birefringence (CB) and circular dichroism (CD)) of the non-optic axis of the Co(en)_3BrH_2O single crystal which has a uni-axis by applying a high-precision polarization switching.This apparatus will be applied to studies of anisotropy材料的结构和电子状态。