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Development of the oscillation system for a micro-are monochromatic X-ray diffractometer.

微弧单色X射线衍射仪振荡系统的研制。

基本信息

批准号：
14540453
负责人：
HAGIYA Kenji
金额：
$ 2.05万
依托单位：
Himeji Institute of Technology
依托单位国家：
日本
项目类别：
Grant-in-Aid for Scientific Research (C)
财政年份：
2002
资助国家：
日本
起止时间：
2002 至 2003
项目状态：
已结题

项目摘要

Studies on textural inhomogeneity like micro-domains and crystallites segregated from the host crystals are important for investigation of growing and/or cooling process recorded in the rock-forming and synthetic mineral crystals. The phenomena are usually examined by optical microscopy and/or electron-probe micro-analysis. Very limited number of such samples have been investigated so far by X-ray diffraction, because the samples (30μm in thickness) are mounted on sides 1.4mm thick (thin sections). The diffraction system with the micro-pinhole and been developed to measure diffraction from micro-domains with the monochromatic X-ray beam. The effective deameter of a micro-pinhole is 2.0μm for 0.7A^^° with a divergence 24μrad.In the previous experiment, we had difficulty with setting the sample position on the axis of rotation. Therefore an x-stage installed on a rotating stage of the sample has been prepared for setting the sample. The x-stage was controlled as the position of the sample setting on the micro-beam with a calibration curve determined before the experiments. However, the program to control the x-stage did not give the satisfying results, the improvement of the program is now in progress.To check the performance of the system, two kinds of thin sections were prepared for the diffraction experiments : one is a thin section of Cr-spinel crystals segregated from olivine host crystal in dunite from Iwanai-dake, Hokkaido, Japan and the other thin sections of the metamorphic rocks including jadeite, omphacite and riebeckite. The oscillation photographs of several kinds of mineral were successfully recorded on a flat imaging plate. The analysis of the diffraction data is now in progress.

研究结构的不均匀性，如微畴和微晶从主晶体分离是重要的研究的生长和/或冷却过程中记录的岩石形成和合成矿物晶体。这些现象通常通过光学显微镜和/或电子探针显微分析来检查。到目前为止，通过X射线衍射研究的此类样品数量非常有限，因为样品（30μm厚）安装在1.4mm厚的侧面（薄切片）上。本文介绍了一种利用单色X射线束测量微区衍射的微针孔衍射系统。在0.7A^^°下，发散角为24μrad时，微针孔的有效发散角为2.0μm。因此，已经准备了安装在样品的旋转台上的X台以用于设置样品。X-台被控制为样品设置在微梁上的位置，具有在实验之前确定的校准曲线。然而，X-平台的控制程序并没有给出令人满意的结果，目前正在对程序进行改进。为了检查系统的性能，制备了两种薄切片用于衍射实验：一个是从北海道岩内岳纯橄榄岩中的橄榄石主晶中分离出来的铬尖晶石晶体的薄片，日本等地的薄段变质岩包括硬玉、绿辉石和钠闪石。在平板成象板上成功地记录了几种矿物的振动图象。衍射数据的分析目前正在进行中。