Brightness and coherence of electron beam emitted from a multi-wall carbon nanotube
Brightness and coherence of electron beam emitted from a multi-wall carbon nanotube
批准号:
14550024
负责人:
OHSHITA Akinori
金额:
$2.11万
依托单位:
依托单位国家:
日本
项目类别:
Grant-in-Aid for Scientific Research (C)
财政年份:
2002
资助国家:
日本
项目状态:
已结题
起止时间:
2002 至 2003
中文摘要
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英文摘要
1. A capped multiwall carbon nanotube with a clean surface gives filed emission patterns consisting of six pentagonal rings corresponding to pentagons located at the tip. To evaluate the optical properties of a single pentagon as an electron source, the I-V characteristics and angular current densities for a single clean pentagon have been measured, by probe-hole-type field emission microscopy. Reduced brightness estimated from the angular current density and the geometrical size of the pentagon reached 〜5.6×109 Am-2sr-1 V-1 at an emission current of 53nA. This value is one order of magnitude or more higher than that of an individual multiwall carbon nanotube field emitter reported by Jonge et al.2. A capped multiwall carbon nanotube with clean surface gives field emission patterns consisting six pentagonal rings which correspond to pentagons located at the tip end. One or a few bright streaks are also observed at the boundaries of neighboring pentagons. The spacing of streaks is inversely proportional to the square root of the accelerating voltage. Namely, the spacing changes with the wave length of emitted electrons according to Young's interference equation. The visibility of streaks increased with the accelerating voltage, which can be explained successfully in terms of a concept of a virtual source size. These experimental results suggest that the streaks are no more than Young's interference fringes for which the adjacent pentagons behave as double slits.3. The direct observation method of electromagnetic micro-fields with an electron biprism is developed. This interference method is simpler and more effective than the three-wave interference one.
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Akinori Ohshita: "Influence of operating conditions of electron biprisms of three-electron-wave interference pattern"Proc. of the 15th International Congress on Electron Microscopy. 3. 315 (2002)
Akinori Ohshita:“三电子波干涉图案的电子双棱镜操作条件的影响”Proc。
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A.Ohdhita: "Influence of operating conditions of electron biprisms cf three-electron-wave interference pattern"Proc.of the 15th International Congress on Electron Microscopy. 3. 315-316 (2002)
A.Ohdhita:“电子双棱镜操作条件对三电子波干涉图样的影响”第 15 届国际电子显微镜大会论文集。
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akinori Ohsita: "Direct visualization of electromagnetic microfields by new double-exposure electron holography"Electron Microscopy and Analysis 2003. 215-218 (2003)
akinori Ohsita:“通过新型双曝光电子全息术直接可视化电磁微场”电子显微镜与分析 2003. 215-218 (2003)
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Akinori Ohshita: "Direct visualization of magnetic micro-field around a Barium ferrite particle by modified double-exposure electron holography"13th European Microscopy Congress. (受理、発表予定). (2004)
Akinori Ohshita:“通过改进的双曝光电子全息术直接可视化钡铁氧体颗粒周围的磁微场”第 13 届欧洲显微镜大会(已接受,计划演示)(2004 年)。
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K.Hata: "Interference Fringes Observed in Electron Emission Patterns of a Multi-wall Carbon Nanotube"J.Vac.Sci.Technol.. (in press). (2004)
K.Hata:“在多壁碳纳米管的电子发射模式中观察到的干涉条纹”J.Vac.Sci.Technol..(正在出版)。
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共 17 条
Measurement of degree of coherence of electron beam emitted from a carbon nanotube tip
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批准号:16360019
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项目类别:Grant-in-Aid for Scientific Research (B)
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资助金额:$6.46万
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财政年份:2004
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负责人:OHSHITA Akinori
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依托单位:
Three-electron-wave interference method for direct observation of electromagnetic micro-fields
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批准号:09650029
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项目类别:Grant-in-Aid for Scientific Research (C)
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资助金额:$1.54万
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财政年份:1997
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负责人:OHSHITA Akinori
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依托单位:
NUMERICAL RECONSTRUCTION METHOD FOR HIGHER SPATIAL RESOLUTION IN ELECTRON HOLOGRAPHY
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批准号:04650038
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项目类别:Grant-in-Aid for General Scientific Research (C)
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资助金额:$1.28万
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财政年份:1992
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负责人:OHSHITA Akinori
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依托单位:
海外基金