Local state analysis of organic semiconductor thin films by spatially and angular resolved electron energy-loss spectroscopy

通过空间和角分辨电子能量损失光谱对有机半导体薄膜进行局域态分析

• 批准号: 15310089
• 负责人: KURATA Hiroki
• 金额: $ 8.19万
• 依托单位: KYOTO UNIVERSITY
• 依托单位国家: 日本
• 项目类别: Grant-in-Aid for Scientific Research (B)
• 财政年份: 2003
• 资助国家: 日本
• 起止时间: 2003 至 2006
• 项目状态: 已结题
• 来源: https://kaken.nii.ac.jp/grant/KAKENHI-PROJECT-15310089/
• 关键词: Electron energy-loss spectroscopy; Electron microscopy; Energy-loss near-edge structure; Organic thin films; Spatially resolved EELS; Angular resolved EELS; First principles calculation; 電子線損傷

Local state analysis on organic thin films has been performed by electron energy-loss spectroscopy combined with transmission electron microscopy. The energy-loss near-edge structure (ELNES) was measured from 7,7,8,8,-tetracyanoquinodimethane (TCNG) and its fluorine derivative (F_4TCNQ) by the EELS and analyzed by theoretical calculation. The spatially resolved ELNES was calculated by including a core-hole at independent carbon sites in the molecules. Then the structure in the ELNES was interpreted by unoccupied molecular orbitals and the change of electronic structure due to fluorination effects was shown. The including a core-hole into the calculation is very useful to interpret spatially resolved EELS because an excited site is explicit in a molecule.In order to investigate the mechanism of radiation damage of organic crystals the changes of ELNES was examined in detail for halogenated metal-phthalocyanine thin films. As for the halogenations effect, it was reveal that the substitution by chlorine and bromine atoms reinforced the molecules against electron irradiation, while the fluorinations did not improved so much, which was interpreted as the molecular packing effect in the crystals.As an application of angular resolved EELS for organic crystal thin films, a new method to determine the orientation of a planar molecule grown on a substrate epitaxially has been developed. In the carbon K-edge ELNES, 1s→π^* transition peak with a directivity to out of plane of a molecule is generally observed for conjugated molecular crystals. The new method is to measure the two dimensional angular distribution of 1s→π^* intensity directly by an energy filtering transmission electron microscopy. The angular distribution makes it possible to determine the inclining angle of molecule as well as the direction of tilting axis. In the present study, the application to chlorinated cupper-phthalocyanine thin film has been demonstrate.

用电子能量损失谱结合透射电子显微镜对有机薄膜进行了局域态分析。用电子能量损失谱（EELS）测量了7，7，8，8-四氰基醌二甲烷（TCNG）及其氟衍生物（F_4TCNQ）的能量损失近边结构（ELNES），并进行了理论计算分析。通过在分子中的独立碳位点处包括核心空穴来计算空间分辨ELNES。然后用未占轨道解释了ELNES的结构，并说明了电子结构的变化是由电子自旋效应引起的。由于激发位置在分子中是明确的，因此在计算中加入芯孔对解释空间分辨的EELS是非常有用的。为了研究有机晶体的辐射损伤机制，我们详细地研究了卤化金属酞菁薄膜的ELNES的变化。对于卤代效应，发现氯原子和溴原子的取代增强了分子对电子辐照的抵抗能力，而氟原子的取代并没有明显改善，这可能是晶体中的分子堆积效应。已经开发了一种确定在衬底上外延生长的平面分子的取向的新方法。在碳K边ELNES中，对于共轭分子晶体，通常观察到具有指向性的分子面外的1 s →π^* 跃迁峰。新方法是用能量过滤透射电子显微镜直接测量1 s →π^* 强度的二维角分布。利用角分布可以确定分子的倾斜角和倾斜轴的方向。在本研究中，应用于氯化铜酞菁薄膜已被证明。

项目成果

D.Takajo: "Replacement of molecules at liquid/solid interfaces"Thin Solid Film. 438-439. 428-432 (2003)

D.Takajo：“液/固界面分子的替换”固体薄膜。

非弾性散乱強度の角度分布による分子配向決定

通过非弹性散射强度的角分布确定分子取向

• 发表时间: 2006
• 期刊: まてりあ 45
• 作者: M.Koshino;T.Yaji;A.Scaper;M.Koshino;A.Schaper;T.Yaji;A.Schaper;Y.Kubota;T.Kiyomura;D.Takajo;T.Kiyomura;倉田博基
• 通讯作者: 倉田博基

In-situ AFM observation of the deposition process in monomolecular organic layers

单分子有机层沉积过程的原位 AFM 观察

• 发表时间: 2004
• 期刊: Jap. J. Appl. Phys. 7B
• 作者: M.Koshino;T.Yaji;A.Scaper;M.Koshino;A.Schaper;T.Yaji;A.Schaper;Y.Kubota;T.Kiyomura;D.Takajo;T.Kiyomura;倉田博基;Y.Kubota;D.Takajo;T.Kiyomura;H.Kurata;Y.Kubota;T.Kiyomura;M.Tsujimoto;M.Koshino;M.Tsujimoto;M.Koshino;M.Tsujimoto;M.Koshino;Y.Yoshioka;M.Koshino;Y.Miyamoto
• 通讯作者: Y.Miyamoto

DV-Xα calculation of electron energy-loss near-edge structures of 2,3,5,6-tetrafluoro-7,7,8,8-tetracyanoquinodimethane (F_4TCNQ)

2,3,5,6-四氟-7,7,8,8-四氰基醌二甲烷(F_4TCNQ)电子能量损失近边缘结构的DV-Xα计算

• 发表时间: 2004
• 期刊: J.Electron Spectroscopy and Related Pheno. 135
• 作者: M.Koshino;T.Yaji;A.Scaper;M.Koshino;A.Schaper;T.Yaji;A.Schaper;Y.Kubota;T.Kiyomura;D.Takajo;T.Kiyomura;倉田博基;Y.Kubota;D.Takajo;T.Kiyomura;H.Kurata;Y.Kubota;T.Kiyomura;M.Tsujimoto;M.Koshino;M.Tsujimoto;M.Koshino;M.Tsujimoto;M.Koshino;Y.Yoshioka;M.Koshino;Y.Miyamoto;Y.Yoshioka;D.Takajo;M.Koshino;Y.Miyamoto;Y.Kubota;M.Koshino
• 通讯作者: M.Koshino

Radiation damage analysis of 7,7,8,8,-tetracyanoquinodimethane (TCNQ) and 2,3,5,6,- tetrafluoro-7, 7,8, 8,-tetracyanoquinodimethane (F_4TCNQ) by electron diffraction and electron energy loss spectroscopy

通过电子衍射和电子能量损失光谱分析 7,7,8,8,-四氰基醌二甲烷 (TCNQ) 和 2,3,5,6,-四氟-7,7,8,8,-四氰基醌二甲烷 (F_4TCNQ)

• 发表时间: 2005
• 期刊: Micron 36
• 作者: M.Koshino;T.Yaji;A.Scaper;M.Koshino;A.Schaper;T.Yaji;A.Schaper;Y.Kubota;T.Kiyomura;D.Takajo;T.Kiyomura;倉田博基;Y.Kubota;D.Takajo;T.Kiyomura;H.Kurata;Y.Kubota;T.Kiyomura;M.Tsujimoto;M.Koshino;M.Tsujimoto;M.Koshino
• 通讯作者: M.Koshino