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Local state analysis of organic semiconductor thin films by spatially and angular resolved electron energy-loss spectroscopy

Local state analysis of organic semiconductor thin films by spatially and angular resolved electron energy-loss spectroscopy
通过空间和角分辨电子能量损失光谱对有机半导体薄膜进行局域态分析
批准号:
15310089
负责人:
KURATA Hiroki
金额:
$8.19万
依托单位:
依托单位国家:
日本
项目类别:
Grant-in-Aid for Scientific Research (B)
财政年份:
2003
资助国家:
日本
项目状态:
已结题
起止时间:
2003 至 2006

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中文摘要
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英文摘要
Local state analysis on organic thin films has been performed by electron energy-loss spectroscopy combined with transmission electron microscopy. The energy-loss near-edge structure (ELNES) was measured from 7,7,8,8,-tetracyanoquinodimethane (TCNG) and its fluorine derivative (F_4TCNQ) by the EELS and analyzed by theoretical calculation. The spatially resolved ELNES was calculated by including a core-hole at independent carbon sites in the molecules. Then the structure in the ELNES was interpreted by unoccupied molecular orbitals and the change of electronic structure due to fluorination effects was shown. The including a core-hole into the calculation is very useful to interpret spatially resolved EELS because an excited site is explicit in a molecule.In order to investigate the mechanism of radiation damage of organic crystals the changes of ELNES was examined in detail for halogenated metal-phthalocyanine thin films. As for the halogenations effect, it was reveal that the substitution by chlorine and bromine atoms reinforced the molecules against electron irradiation, while the fluorinations did not improved so much, which was interpreted as the molecular packing effect in the crystals.As an application of angular resolved EELS for organic crystal thin films, a new method to determine the orientation of a planar molecule grown on a substrate epitaxially has been developed. In the carbon K-edge ELNES, 1s→π^* transition peak with a directivity to out of plane of a molecule is generally observed for conjugated molecular crystals. The new method is to measure the two dimensional angular distribution of 1s→π^* intensity directly by an energy filtering transmission electron microscopy. The angular distribution makes it possible to determine the inclining angle of molecule as well as the direction of tilting axis. In the present study, the application to chlorinated cupper-phthalocyanine thin film has been demonstrate.
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DOI: --
发表时间:
期刊:
影响因子: --
作者: []
通讯作者:
非弾性散乱強度の角度分布による分子配向決定
通过非弹性散射强度的角分布确定分子取向
DOI: --
发表时间: 2006
期刊: まてりあ 45
影响因子: --
作者: [M.Koshino, T.Yaji, A.Scaper, M.Koshino, A.Schaper, T.Yaji, A.Schaper, Y.Kubota, T.Kiyomura, D.Takajo, T.Kiyomura, 倉田博基]
通讯作者: 倉田博基
DOI: --
发表时间: 2004
期刊: Jap. J. Appl. Phys. 7B
影响因子: --
作者: [M.Koshino, T.Yaji, A.Scaper, M.Koshino, A.Schaper, T.Yaji, A.Schaper, Y.Kubota, T.Kiyomura, D.Takajo, T.Kiyomura, 倉田博基, Y.Kubota, D.Takajo, T.Kiyomura, H.Kurata, Y.Kubota, T.Kiyomura, M.Tsujimoto, M.Koshino, M.Tsujimoto, M.Koshino, M.Tsujimoto, M.Koshino, Y.Yoshioka, M.Koshino, Y.Miyamoto]
通讯作者: Y.Miyamoto
DV-Xα calculation of electron energy-loss near-edge structures of 2,3,5,6-tetrafluoro-7,7,8,8-tetracyanoquinodimethane (F_4TCNQ)
2,3,5,6-四氟-7,7,8,8-四氰基醌二甲烷(F_4TCNQ)电子能量损失近边缘结构的DV-Xα计算
DOI: --
发表时间: 2004
期刊: J.Electron Spectroscopy and Related Pheno. 135
影响因子: --
作者: [M.Koshino, T.Yaji, A.Scaper, M.Koshino, A.Schaper, T.Yaji, A.Schaper, Y.Kubota, T.Kiyomura, D.Takajo, T.Kiyomura, 倉田博基, Y.Kubota, D.Takajo, T.Kiyomura, H.Kurata, Y.Kubota, T.Kiyomura, M.Tsujimoto, M.Koshino, M.Tsujimoto, M.Koshino, M.Tsujimoto, M.Koshino, Y.Yoshioka, M.Koshino, Y.Miyamoto, Y.Yoshioka, D.Takajo, M.Koshino, Y.Miyamoto, Y.Kubota, M.Koshino]
通讯作者: M.Koshino
28
    Local state analysis of interfaces and defect regions by spherical aberration corrected STEM-EELS
    • 批准号:
      19310071
    • 项目类别:
      Grant-in-Aid for Scientific Research (B)
    • 资助金额:
      $10.15万
    • 财政年份:
      2007
    • 负责人:
      KURATA Hiroki
    • 依托单位:
    海外基金