Local state analysis of organic semiconductor thin films by spatially and angular resolved electron energy-loss spectroscopy

通过空间和角分辨电子能量损失光谱对有机半导体薄膜进行局域态分析

• 批准号: 15310089
• 负责人: KURATA Hiroki
• 金额: $ 8.19万
• 依托单位: KYOTO UNIVERSITY
• 依托单位国家: 日本
• 项目类别: Grant-in-Aid for Scientific Research (B)
• 财政年份: 2003
• 资助国家: 日本
• 起止时间: 2003 至 2006
• 项目状态: 已结题
• 来源: https://kaken.nii.ac.jp/grant/KAKENHI-PROJECT-15310089/
• 关键词: Electron energy-loss spectroscopy; Electron microscopy; Energy-loss near-edge structure; Organic thin films; Spatially resolved EELS; Angular resolved EELS; First principles calculation; 電子線損傷

Local state analysis on organic thin films has been performed by electron energy-loss spectroscopy combined with transmission electron microscopy. The energy-loss near-edge structure (ELNES) was measured from 7,7,8,8,-tetracyanoquinodimethane (TCNG) and its fluorine derivative (F_4TCNQ) by the EELS and analyzed by theoretical calculation. The spatially resolved ELNES was calculated by including a core-hole at independent carbon sites in the molecules. Then the structure in the ELNES was interpreted by unoccupied molecular orbitals and the change of electronic structure due to fluorination effects was shown. The including a core-hole into the calculation is very useful to interpret spatially resolved EELS because an excited site is explicit in a molecule.In order to investigate the mechanism of radiation damage of organic crystals the changes of ELNES was examined in detail for halogenated metal-phthalocyanine thin films. As for the halogenations effect, it was reveal that the substitution by chlorine and bromine atoms reinforced the molecules against electron irradiation, while the fluorinations did not improved so much, which was interpreted as the molecular packing effect in the crystals.As an application of angular resolved EELS for organic crystal thin films, a new method to determine the orientation of a planar molecule grown on a substrate epitaxially has been developed. In the carbon K-edge ELNES, 1s→π^* transition peak with a directivity to out of plane of a molecule is generally observed for conjugated molecular crystals. The new method is to measure the two dimensional angular distribution of 1s→π^* intensity directly by an energy filtering transmission electron microscopy. The angular distribution makes it possible to determine the inclining angle of molecule as well as the direction of tilting axis. In the present study, the application to chlorinated cupper-phthalocyanine thin film has been demonstrate.

对有机薄膜的局部状态分析已经通过电子损失光谱与透射电子显微镜结合进行。能量损失的近距离结构（Elnes）从7,7,8,8，-tetracyanoquinodimethane（TCNG）及其氟衍生物（F_4TCNQ）测量，并通过鳗鱼进行了分析，并通过理论计算进行分析。通过在分子中的独立碳位点包括一个核心孔来计算空间分辨的Elnes。然后，通过未占用的分子轨道来解释Elnes中的结构，并显示了由于荧光效应而引起的电子结构的变化。计算中的核心孔对于解释经常解析的鳗鱼非常有用，因为令人兴奋的位点在分子中是明确的。 As for the halogenations effect, it was revealed that the subscription by chlorine and bromine atoms reinforced the molecules against electron irradiation, while the fluorinations did not improved so much, which was interpreted as the molecular packing effect in the crystals.As an application of angular resolved EELS for organic crystal thin films, a new method to determine the orientation of a planar molecule grown on a substrate epitaxially已经开发了。在碳k边缘Elnes中，对于连接的分子晶体，通常观察到具有方向性的1s→π^*过渡峰。新方法是通过通过能量滤波透射电子显微镜直接测量1S→π^*强度的两维角分布。角度分布使确定分子的倾斜角以及倾斜轴的方向成为可能。在本研究中，已经证明了对氯化二苯胺薄膜的应用。

项目成果

D.Takajo: "Replacement of molecules at liquid/solid interfaces"Thin Solid Film. 438-439. 428-432 (2003)

D.Takajo：“液/固界面分子的替换”固体薄膜。

In-situ AFM observation of the deposition process in monomolecular organic layers

单分子有机层沉积过程的原位 AFM 观察

• 发表时间: 2004
• 期刊: Jap. J. Appl. Phys. 7B
• 作者: M.Koshino;T.Yaji;A.Scaper;M.Koshino;A.Schaper;T.Yaji;A.Schaper;Y.Kubota;T.Kiyomura;D.Takajo;T.Kiyomura;倉田博基;Y.Kubota;D.Takajo;T.Kiyomura;H.Kurata;Y.Kubota;T.Kiyomura;M.Tsujimoto;M.Koshino;M.Tsujimoto;M.Koshino;M.Tsujimoto;M.Koshino;Y.Yoshioka;M.Koshino;Y.Miyamoto
• 通讯作者: Y.Miyamoto

非弾性散乱強度の角度分布による分子配向決定

通过非弹性散射强度的角分布确定分子取向

• 发表时间: 2006
• 期刊: まてりあ 45
• 作者: M.Koshino;T.Yaji;A.Scaper;M.Koshino;A.Schaper;T.Yaji;A.Schaper;Y.Kubota;T.Kiyomura;D.Takajo;T.Kiyomura;倉田博基
• 通讯作者: 倉田博基

DV-Xα calculation of electron energy-loss near-edge structures of 2,3,5,6-tetrafluoro-7,7,8,8-tetracyanoquinodimethane (F_4TCNQ)

2,3,5,6-四氟-7,7,8,8-四氰基醌二甲烷(F_4TCNQ)电子能量损失近边缘结构的DV-Xα计算

• 发表时间: 2004
• 期刊: J.Electron Spectroscopy and Related Pheno. 135
• 作者: M.Koshino;T.Yaji;A.Scaper;M.Koshino;A.Schaper;T.Yaji;A.Schaper;Y.Kubota;T.Kiyomura;D.Takajo;T.Kiyomura;倉田博基;Y.Kubota;D.Takajo;T.Kiyomura;H.Kurata;Y.Kubota;T.Kiyomura;M.Tsujimoto;M.Koshino;M.Tsujimoto;M.Koshino;M.Tsujimoto;M.Koshino;Y.Yoshioka;M.Koshino;Y.Miyamoto;Y.Yoshioka;D.Takajo;M.Koshino;Y.Miyamoto;Y.Kubota;M.Koshino
• 通讯作者: M.Koshino

DV-X□ calculation of electron energy- loss near-edge structures of 2,3,5,6-tetrafluoro-7,7,8,8- tetracyanoquinodimethane (F_4TCNQ)

DV-X□计算2,3,5,6-四氟-7,7,8,8-四氰基醌二甲烷(F_4TCNQ)近边缘结构的电子能量损失

• 发表时间: 2004
• 期刊: J Electron Spectroscopy and Related Pheno. 135
• 作者: M.Koshino;T.Yaji;A.Scaper;M.Koshino;A.Schaper;T.Yaji;A.Schaper;Y.Kubota;T.Kiyomura;D.Takajo;T.Kiyomura;倉田博基;Y.Kubota;D.Takajo;T.Kiyomura;H.Kurata;Y.Kubota;T.Kiyomura;M.Tsujimoto;M.Koshino;M.Tsujimoto;M.Koshino;M.Tsujimoto;M.Koshino;Y.Yoshioka;M.Koshino;Y.Miyamoto;Y.Yoshioka;D.Takajo;M.Koshino
• 通讯作者: M.Koshino