A search for muon-lepton-flavor violation process with high intensity muon source

高强度μ子源寻找μ子轻子味破坏过程

• 批准号: 17340077
• 负责人: AOKI Masaharu
• 金额: $ 10.05万
• 依托单位: Osaka University
• 依托单位国家: 日本
• 项目类别: Grant-in-Aid for Scientific Research (B)
• 财政年份: 2005
• 资助国家: 日本
• 起止时间: 2005 至 2006
• 项目状态: 已结题
• 来源: https://kaken.nii.ac.jp/grant/KAKENHI-PROJECT-17340077/
• 关键词: particle physics; particle detector; lepton flavor violation; muon; straw chamber; electrically conductive PEEK; lepton universarity; ミューオン・電子転換; カソード読み出し; ポールゼロキャンセル; BJTアンプ

Electrically conductive PEEK straws (5mm φ, 20 μm-t, 800mm-l) were test-produced by GUNZE. Linearity of the tubes was substantially improved from the samples produced at 2003.According to our studies, it is well known that the electrically conductive PEEK is suited for the straw chamber. However, due to the high resistance (about a few M Ω/□) of the PEEK tube, it is necessary to prevent a charge-up of thetube, especially for the condition of high counting rate. We tested the idea of direct bonding of cathode-pads to the straw exteriors. Because of the inter-pad resistance by the straw is almost 800 kΩ, which is much higher than the input impedance of the pre-amplifier, the effect of cross-talk is negligibly small. The observed charge distribution and total charge were improved by this method.We also developed a test IC (BJT process) for cathode-pad readout. This IC has a capability of adjusting the pole-zero cancellation parameter.We modified 500-MHz FADC for COPPER system so that it can be used for the high count rate condition. The operation mode of the system was changed by re-programming of a FPGA. A new module for synchronizing multiple COPPER boards was fabricated.This new COPPER system was tested at TRIUMF with an experiment measuring π^+ → e^+υ branching ratio. The system provided good information of the pulse shape from plastic counters, and the double pulses were successfully separated by the system. The physics of the experiment is quite relevant to the muon-lepton-flavor violation process.

GUNZE公司试制了5 mm φ、20 μm-t、800 mm-1的PEEK导电吸管。与2003年生产的样品相比，管的线性有了很大的改善。根据我们的研究，众所周知，导电PEEK适合用于吸管室。然而，由于PEEK管的高电阻（约几M Ω/□），必须防止管的充电，特别是对于高计数率的情况。我们测试了阴极焊盘直接粘合到吸管外部的想法。由于吸管的焊盘间电阻接近800 kΩ，远高于前置放大器的输入阻抗，因此串扰的影响很小，可以忽略不计。我们也研制了一个测试电路（BJT工艺），用来测试阴极焊盘读出。该集成电路具有零极点相消参数可调的功能，并对500 MHz FADC进行了改进，使其适用于高计数率条件。通过对FPGA的重新编程，改变了系统的工作模式。研制了一种新的多块COPPER板同步模块，并在TRIUMF上进行了π^+ → e^+ π分支比测量实验。该系统提供了良好的塑料计数器脉冲波形信息，并成功地分离了双脉冲。实验的物理性质与μ子-轻子-味破坏过程密切相关。

项目成果

PRISMとμ-e転換過程探索実験

PRISM与μ-e转换过程探索实验

• 发表时间: 2007
• 期刊: めそん 25
• 作者: H. Ohno;T. Umeda and K. Kanaya;Takashi Umeda;Kazuyuki Kanaya;梅田貴士;Hiroshi Ohno;Kazuyuki Kanaya;Y. Maezawa;H. Ohno;T. Umeda;S. Ejiri;S. Ejiri;Y. Maezawa;T. Umeda;T. Umeda;Y. Maezawa;T. Umeda;S. Ejiri;Y. Maezawa;T. Umeda;Y. Maezawa;Y. Maezawa;Y. Maezawa;S. Ejiri;Y. Maezawa;Y. Maezawa;S. Ejiri;Y. Maezawa;Y. Maezawa;S. Ejiri;N. Ukita;Kaoru Yamada;青木正治
• 通讯作者: 青木正治

Pion Decay-Mode Tagging in a Plastic Scintillator Using COPPER 500-MHz FADC

使用 COPPER 500-MHz FADC 在塑料闪烁体中进行 Pion 衰变模式标记

• 发表时间: 2007
• 期刊: IEEE Transactions on Nuclear Science (printing)
• 作者: H. Ohno;T. Umeda and K. Kanaya;Takashi Umeda;Kazuyuki Kanaya;梅田貴士;Hiroshi Ohno;Kazuyuki Kanaya;Y. Maezawa;H. Ohno;T. Umeda;S. Ejiri;S. Ejiri;Y. Maezawa;T. Umeda;T. Umeda;Y. Maezawa;T. Umeda;S. Ejiri;Y. Maezawa;T. Umeda;Y. Maezawa;Y. Maezawa;Y. Maezawa;S. Ejiri;Y. Maezawa;Y. Maezawa;S. Ejiri;Y. Maezawa;Y. Maezawa;S. Ejiri;N. Ukita;Kaoru Yamada
• 通讯作者: Kaoru Yamada

PRISM and Searching for μ-e Conversion

PRISM 和寻找 μ-e 转换

• 发表时间: 2007
• 期刊: Meson 25
• 作者: H. Ohno;T. Umeda and K. Kanaya;Takashi Umeda;Kazuyuki Kanaya;梅田貴士;Hiroshi Ohno;Kazuyuki Kanaya;Y. Maezawa;H. Ohno;T. Umeda;S. Ejiri;S. Ejiri;Y. Maezawa;T. Umeda;T. Umeda;Y. Maezawa;T. Umeda;S. Ejiri;Y. Maezawa;T. Umeda;Y. Maezawa;Y. Maezawa;Y. Maezawa;S. Ejiri;Y. Maezawa;Y. Maezawa;S. Ejiri;Y. Maezawa;Y. Maezawa;S. Ejiri;N. Ukita;Kaoru Yamada;青木正治;Kaoru Yamada et al.;Masaharu Aoki
• 通讯作者: Masaharu Aoki