Development and application of X-ray differential phase microscopy with X-ray Talbot interferometer

利用X射线透射光栅的X射线相位测量技术，包括X射线塔尔博特干涉法，结合具有菲涅耳波带片的X射线成像显微镜，已经开发出X射线相敏成像显微镜，使得能够对弱吸收物体（诸如聚合物和生物组织）进行高灵敏度和高分辨率的观察。此外，通过在多个投影方向上重复相位测量，还证明了折射率的三维图像重建（X射线相位断层摄影）。

Using the X-ray phase measurement techniques with X-ray transmission grating(s), including X-ray Talbot interferometry, in combination with an X-ray imaging microscope with a Fresnel zone plate, X-ray phase-sensitive imaging microscopy has been developed, enabling high-sensitive and high-resolution observation for weakly absorbing objects, such as polymers and biological tissues. In addition, by repeating the phase measurement at plural projection directions, three-dimensional image reconstruction of the refractive index (X-ray phase tomography) has also been demonstrated.