Research on High Dependable Test for Crosstalk Faults in High Speed VLSIs

点击翻译按钮获取中文摘要

In this research, a testing method for crosstalk faults in VLSI (Very Large Scaled Integrated Circuit) circuits has been proposed. A crosstalk fault is induced by coupling interaction between neighbor two lines, and it is hard to detect by the testing method for conventional fault models. We analyzed the fault behavior of crosstalk faults to define a fault model, and proposed a test generation method. Moreover we enhanced the method for transistor shorts to improve fault diagnosis and test pattern generation.