Study of hydrogen plasma affected by strong outer electric field
Study of hydrogen plasma affected by strong outer electric field
批准号:
20740324
负责人:
MATSUMOTO Yoshikatsu
金额:
$1.75万
依托单位国家:
日本
项目类别:
Grant-in-Aid for Young Scientists (B)
财政年份:
2008
资助国家:
日本
项目状态:
已结题
起止时间:
2008 至 2009
中文摘要
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英文摘要
We calculate potential spatial structure at extraction region in a negative ion source with two dimensional Particle-In-Cell(PIC) method. It is confirmed that extraction electric field produced by high beam extraction voltage invades into the ion source plasma though a beam extraction hole. Besides, H^- extraction probability is calculated with H^- trajectory calculation in Monte Carlo method. Then, potential structure needed for the H^- extraction model is assumed by the calculation result of the PIC code. A calculation result with the extraction model is in good agreement with experimental result in H^- extraction probability. From some calculation results with the model, we conclude that potential structure for perpendicular direction to H^- beam axis is a key factor for H^- extraction from a negative ion source.
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Dependence of H^- Velocity Distribution in Ion Source Plasma upon Extracted H^- Beam Current
离子源等离子体中 H^- 速度分布对提取的 H^- 束流的依赖性
DOI:
--
发表时间:
2009
期刊:
影响因子:
--
作者:
[K.Fujikawa, et. al., 松本新功]
通讯作者:
松本新功
Dependence of H- Velocity Distribution in Ion Source Plasma upon Extracted HBeam Current
离子源等离子体中的 H 速度分布对提取的 HBeam 电流的依赖性
DOI:
--
发表时间:
2009
期刊:
影响因子:
--
作者:
[Y. Matsumoto, M. Nishiura, M. Sasao, H. Yamaoka, K. Shinto, M. Wada]
通讯作者:
M. Wada
Influence of H- velocity on H- extraction probability from a negative ion source.
H 速度对从负离子源提取 H 的概率的影响。
DOI:
10.1063/1.3271436
发表时间:
2010
期刊:
The Review of scientific instruments
影响因子:
--
作者:
[Y. Matsumoto, M. Nishiura, K. Shinto, H. Yamaoka, M. Sasao, M. Wada]
通讯作者:
M. Wada
H-イオン源におけるH-引き出しモデルの精密化
H 离子源中 H 提取模型的细化
DOI:
--
发表时间:
2010
期刊:
影响因子:
--
作者:
[松本新功, 西浦正樹, 山岡人志, 神藤勝啓, 笹尾真実子, 和田元]
通讯作者:
和田元
H^-イオン源におけるH^-引き出しモデルの精密化
H^-离子源中 H^-提取模型的细化
DOI:
--
发表时间:
2010
期刊:
影响因子:
--
作者:
[H.Ito, et. al., 松本新功]
通讯作者:
松本新功
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