Development of White X-ray system for detection of internal crack in material and strain mapping near it

我们研究了该测量系统，该系统可以利用从同步辐射获得的高能白X射线，在相同的仪器环境中，通过CT和附近的应变映射对导致破坏的材料中的裂纹进行无损检测。在此基础上，发展了CT检测内部裂纹的各种测量技术及其附近的应变图。虽然这并未导致建立综合计量系统，但能够说明这一可能性。

We examined the measurement system which makes it possible to perform a nondestructive detection of a crack in a material leading to destruction by CT and strain mapping near it in the same apparatus environment by using the high energy white X-ray obtained from synchrotron radiation. As a result, each measurement technique for the internal crack detection by CT and the strain mapping near it was developed. The possibility was able to be indicated although it did not result in construction of the integrated measurement system.