Studies of the generalized Breit interaction effect in autoionizing states

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Dielectronic recombination processes of few electron heavy highly charged ions have been studied with the Tokyo electron beam ion trap at the University of Electro-Communications. By combining two experiments, X-ray measurements and ion abundance measurements, the angular distribution of X-rays emitted in dielectronic recombination processes has been measured for lithiumlike ions. The dominant contribution of the Breit interaction effect on the angular distribution has been clearly demonstrated.