Measurement and control of charge transfer between organic ultrathin layers and substrates by means of in-situ real-time spectroscopy

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Physical properties of chemically modified silicon surfaces and the orientations ofα-sexithiophene molecules in the ultrathin overlayers were investigated by means of in-situ real-time surface reflectance spectroscopy and photoelectron spectroscopy. The relationship between the orientation and the charge transfer between molecules and substrates has been clarified. The charge transfer remarkably depends on the surface modification, which means the orientation of molecules can be controlled by the modification and substrate temperature.