A novel technique for nano-characterization on electronic devises based on ionic liquid

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Ionic liquids (ILs) have superior properties compared to water and organic solvent, such as high ionic conductivity, non-volatility, and non-combustibility. They are expected to be adopted as a new electrolyte in electrochemistry. The structural analysis of IL/solid interfaces is particularly important because the proposed applications include chemical or electrical reaction on the interfaces. Frequency modulation atomic force microscopy (FM-AFM) can be a powerful technique for their analysis. However, since ILs have high viscosity, FM-AFM imaging using Si cantilevers is considered to be unstable because of extremely low Q-factor in ILs. In this study, a quartz tuning fork with an electrochemically etched W-tip was used as a force sensor for FM-AFM in ILs and IL/solid interfaces were investigated.