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Improvement of Indentation Creep Method for Electronic Packages by Monitoring Stress Relaxation Behavior

Improvement of Indentation Creep Method for Electronic Packages by Monitoring Stress Relaxation Behavior
通过监测应力松弛行为改进电子封装压痕蠕变方法
批准号:
22560070
负责人:
OHGUCHI Ken-ichi
金额:
$2.83万
依托单位:
依托单位国家:
日本
项目类别:
Grant-in-Aid for Scientific Research (C)
财政年份:
2010
资助国家:
日本
项目状态:
已结题
起止时间:
2010 至 2012

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中文摘要
翻译
压痕蠕变试验有望在电子封装强度可靠性评估中得到实际应用。但存在的问题是,由试验得出的蠕变规律与由拉伸蠕变试验得出的蠕变规律不一致。研究表明,这个问题是由压痕试验中计算应力的参考区域的定义引起的。基于这一事实,提出了一种新的压痕试验参考面积和一种通过监测应力松弛行为来评价蠕变特性的压痕试验方法。
英文摘要
The indentation creep test is expected to be put into practical use for evaluating the strength reliability of electronic packages. However, there is a problem that the creep law derived by the test does not correspond to that derived by tensile creep tests. This study showed that this problem was caused by the definition of the reference area for calculating the stress in the indentation test. Based on this fact, a new reference area for indentation tests and a new indentation test method which evaluates creep characteristics by monitoring stress relaxation behavior were proposed.
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会议论文
圧子押込み・深さ保持によるはんだのクリープ特性評価法の提案
使用压头压痕和深度保持的焊料蠕变特性评价方法的提案
DOI: --
发表时间: 2012
期刊:
影响因子: --
作者: [瀧田敦子, 大口健一, 佐々木克彦]
通讯作者: 佐々木克彦
A New Reference Area for Indentation Creep Tests to Obtain Real Steady Creep Strain of Solder Alloy
压痕蠕变试验的新参考区域以获得焊料合金的真实稳态蠕变应变
DOI: --
发表时间: 2013
期刊:
影响因子: --
作者: [Atsuko Takita, Katsuhiko Sasaki, and Ken-ichi Ohguchi]
通讯作者: and Ken-ichi Ohguchi
ELASTO-PLASTIC-CREEP CHARACTERISTICS OF ELECTROPLATED COPPER FOIL AND ITS ESTIMATION BY STEPPED MICRO INDENTATION
  • 批准号:
    19560071
  • 项目类别:
    Grant-in-Aid for Scientific Research (C)
  • 资助金额:
    $2.91万
  • 财政年份:
    2007
  • 负责人:
    OHGUCHI Ken-ichi
  • 依托单位:
海外基金