Correlation Strength Crossover of Auger Recombination Process

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We theoretically investigate the dynamics of photoexcited states in one-dimensional Mott insulators. We adopt the Pariser-Parr-Pople model, and numerically calculate the time development of the nonequilibrium state excited by a light pulse. We investigate the dependence of the dynamics on the Coulomb correlation strength. In the strong correlation region, the Auger recombination where two bound holon-doublon pairs decay into one unbound holon-doublon pair, dominates the decay dynamics. From the strong correlation region to the intermediate correlation region, the Auger recombination process is always dominant, but the charge carries involved in the process cannot be described by a holon and a doublon in the intermediate correlation region. In the crossover region between these two regions, the decay time constant and the Auger coefficient are strongly enhanced, and the decay time constant is consistent with the experimentally obtained value in one-dimensional Mott insulators.