Development of scanning phase measurement electron microscopy and its application to the potential observation in battery

发展了阶段扫描位相测量电子显微镜。在高灵敏度的CCD相机上，通过垂直于干涉条纹方向的一次扫描，获得干涉条纹的一维强度分布，然后进行计算机处理，从而实现了二维相图的高速重建。同样是一种条纹扫描方法，我们的技术能够获得空间分辨率远远小于条纹间距的超分辨率相图。

Stage-scanning phase measurement electron microscopy was developed. One-dimensional intensity profile along interference fringes was acquired on high-sensitive CCD camera by one time stage-scanning perpendicular to the fringe direction, followed by computer processing, resulting in the high-speed reconstruction of two-dimensional phase map. Likewise a fringe-scanning method, our technique enables to obtain a super-resolution phase map that spatial resolution is much smaller than the fringe spacing.