3D Super-Resolution Imaging for High-Speed Defect Inspection by Using Active Spatial Control of Light
3D Super-Resolution Imaging for High-Speed Defect Inspection by Using Active Spatial Control of Light
批准号:
23760112
负责人:
USUKI Shin
金额:
$2.58万
依托单位:
依托单位国家:
日本
项目类别:
Grant-in-Aid for Young Scientists (B)
财政年份:
2011
资助国家:
日本
项目状态:
已结题
起止时间:
2011 至 2012
中文摘要
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英文摘要
First, we proposed the novel technique for the generation and control of 3D structured illumination based on 3D interference of multiple laser beams. Then, we performed numerical simulations for optimizing several parameters such as spatial position of multiple laser beams, incident angles and conditions of polarization of light. Actually, it was found that the 3D structured illumination with high spatial frequencies in all directions could be generated and controlled by phase shift of multiple laser beams. Furthermore, we developed the apparatus for the 3D structured illumination using 4 laser beams interference. As a result of a series ofexperiments, we confirmed the generation and precise control of the 3D structured illumination. In order to realize the 3D super-resolution by the proposed method, it is needed that 3D information of the specimen is reconstructed from obtained image information and given information of the structured illumination. By the series of numerical simulations based on Fourier optics, the 3D super-resolution was confirmed by using 13 obtained 3D images and 3D deconvolution technique.
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ModelingNanoのための3次元光学顕微計測に関する研究(多光束干渉を利用した広範囲3次元変調照明生成・制御装置の開発)
ModelingNano的3D光学显微测量研究(利用多光束干涉开发宽范围3D调制照明生成和控制装置)
DOI:
--
发表时间:
2011
期刊:
影响因子:
--
作者:
[加仲啓祥,臼杵深,三浦憲二郎]
通讯作者:
加仲啓祥,臼杵深,三浦憲二郎
ModelingNanoのための先端的顕微イメージング
ModelingNano 的高级显微成像
DOI:
--
发表时间:
2011
期刊:
影响因子:
--
作者:
[三浦憲二郎,臼杵深]
通讯作者:
三浦憲二郎,臼杵深
DOI:
10.1016/j.cirp.2011.03.053
发表时间:
2011
期刊:
Cirp Annals-manufacturing Technology
影响因子:
4.1
作者:
[S. Takahashi;R. Kudo;S. Usuki;K. Takamasu]
通讯作者:
S. Takahashi;R. Kudo;S. Usuki;K. Takamasu
Resolution-improved digital refocusing microscope for microstructure measurement
用于微观结构测量的分辨率改进的数字重聚焦显微镜
DOI:
--
发表时间:
2012
期刊:
影响因子:
--
作者:
[S. Usuki, M. Uno, K. T. Miura]
通讯作者:
K. T. Miura
3D顕微計測データを用いたナノ・マイクロ形状モデリング:ModelingNano
使用 3D 显微测量数据进行纳米/微米形状建模:ModelingNano
DOI:
--
发表时间:
2011
期刊:
影响因子:
--
作者:
[長谷川将臣, 朱 疆, 田中 智久, 齋藤 義夫, 三浦憲二郎,河内陽介,臼杵深]
通讯作者:
三浦憲二郎,河内陽介,臼杵深
共 23 条
High-Speed Defect Measurement of Next-Generation Semiconductor Wafer Using Active Control of Evanescent Light
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批准号:20569001
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项目类别:Grant-in-Aid for Scientific Research (C)
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资助金额:$2.45万
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财政年份:2008
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负责人:USUKI Shin
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依托单位:
海外基金