Development of a depth profiling system with nano meter order resolution for organic mass spectrometry
Development of a depth profiling system with nano meter order resolution for organic mass spectrometry
批准号:
23710126
负责人:
NINOMIYA Satoshi
金额:
$3.0万
依托单位:
依托单位国家:
日本
项目类别:
Grant-in-Aid for Young Scientists (B)
财政年份:
2011
资助国家:
日本
项目状态:
已结题
起止时间:
2011 至 2012
中文摘要
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英文摘要
In this study, we developed a depth profiling system with nano meter order resolution by using a charged droplet beam. In order to achieve it, we modified the charged droplet beam source, installed the objective lens and beam scanning electrodes, and made a program for automatic measurement. Practical thin films such as polymers and oxides were depth profiled by using the charged droplet beam as a primary probe.
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DOI:
10.1002/rcm.6181
发表时间:
2012-04
期刊:
Rapid communications in mass spectrometry : RCM
影响因子:
--
作者:
[S. Ninomiya;L. Chen;Hiroaki Suzuki;Y. Sakai;K. Hiraoka]
通讯作者:
S. Ninomiya;L. Chen;Hiroaki Suzuki;Y. Sakai;K. Hiraoka
DOI:
10.1002/sia.4843
发表时间:
2012-08
期刊:
Surface and Interface Analysis
影响因子:
1.7
作者:
[Y. Sakai;S. Ninomiya;K. Hiraoka]
通讯作者:
Y. Sakai;S. Ninomiya;K. Hiraoka
Feasibility study of vacuum-type electrospray droplet beam sources
真空型电喷雾液滴束源的可行性研究
DOI:
--
发表时间:
2012
期刊:
影响因子:
--
作者:
[Satoshi Ninomiya, Lee Chuin Chen, Yuji Sakai, Hiroaki Suzuki, Kenzo Hiraoka]
通讯作者:
Kenzo Hiraoka
SIMS 用高輝度帯電液滴ビーム源の開発
SIMS高亮度带电液滴束源的开发
DOI:
--
发表时间:
2012
期刊:
影响因子:
--
作者:
[二宮啓, チェンリーチュイン, 境悠治, 鈴木浩明, 平岡賢三]
通讯作者:
平岡賢三
真空下エレクトロスプレーのエミッタ形状依存性
真空下电喷雾的发射器形状依赖性
DOI:
--
发表时间:
2013
期刊:
影响因子:
--
作者:
[二宮啓, チェンリーチュイン, 境悠治, 平岡賢三]
通讯作者:
平岡賢三
共 11 条
High performance secondary ion mass spectrometry using vacuum-type electrospray droplet ion beams
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批准号:17K05119
-
项目类别:Grant-in-Aid for Scientific Research (C)
-
资助金额:$3.08万
-
财政年份:2017
-
负责人:NINOMIYA Satoshi
-
依托单位:
High resolution 3D imaging with vacuum electrospray droplet ion beams
-
批准号:26505004
-
项目类别:Grant-in-Aid for Scientific Research (C)
-
资助金额:$3.16万
-
财政年份:2014
-
负责人:NINOMIYA Satoshi
-
依托单位:
海外基金