Development of Stress-Mapping Technique with Sub-Microscale Spatial Resolution by Angular dispersive Micro-Raman spectroscopy
Development of Stress-Mapping Technique with Sub-Microscale Spatial Resolution by Angular dispersive Micro-Raman spectroscopy
批准号:
24760088
负责人:
KIMACHI Hirohisa
金额:
$2.91万
依托单位:
依托单位国家:
日本
项目类别:
Grant-in-Aid for Young Scientists (B)
财政年份:
2012
资助国家:
日本
项目状态:
已结题
起止时间:
2012-04-01 至 2014-03-31
中文摘要
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英文摘要
In this study, angular-dispersive-type micro-Raman spectroscopy was developed. In this instrument, the angular dispersive optical system that laser light was made incident from three directions (0, 50, and 100 degree) and detection was in the direction of 0 degree, was constructed. It was successful to determine the crystallographic orientation of Alumina by using angular dispersive properties. Especially, the directions of a-axis and c-axis were determined. Finally, for polycrystalline partially stabilized zirconia (PSZ), the possibility of stress measurement by angular dispersive properties was examined. The amount of Raman shift of PSZ under mechanical loading changed with the incidence angle, and the angular dispersion property was confirmed to be useful for stress measurement of polycrystalline material.
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角度分散型顕微ラマン分光法によるアルミナ単結晶の結晶方位測定
使用角色散显微拉曼光谱测量氧化铝单晶的晶体取向
DOI:
--
发表时间:
2013
期刊:
影响因子:
--
作者:
[菊池将一,S. Heinz, D. Eifler,中村悠太,吉田翔,上野明, 今泉潤哉・市川拓人・來海博央]
通讯作者:
今泉潤哉・市川拓人・來海博央
偏光顕微ラマン分光法を用いた単結晶シリコンの応力成分評価
使用偏振显微拉曼光谱评估单晶硅中的应力分量
DOI:
--
发表时间:
2013
期刊:
影响因子:
--
作者:
[Rie Nakamura, Anil.N.Netravali, 角田恭兵・今泉潤哉・藤井琢士・來海博央, 菊池将一,中井善一,今井貴文,久保薗宏樹,上野明,飴山惠,早水洋介, 中村悠太,菊池将一,吉田翔,上野明,飴山惠, 今泉潤哉・市川拓人・鈴木隆浩・來海博央]
通讯作者:
今泉潤哉・市川拓人・鈴木隆浩・來海博央
偏光顕微ラマン分光法を用いたアルミナの結晶方位測定
使用偏振光显微拉曼光谱测量氧化铝晶体取向
DOI:
--
发表时间:
2014
期刊:
影响因子:
--
作者:
[Rie Nakamura, Goda Koichi (10章), 今井貴文,菊池将一,久保薗宏樹,中井善一,上野明,飴山惠, 角田恭兵・今泉潤哉・藤井琢士・來海博央]
通讯作者:
角田恭兵・今泉潤哉・藤井琢士・來海博央
顕微ラマン分光法を用いたアルミナの高精度結晶方位測定
使用显微拉曼光谱法高精度测量氧化铝晶体取向
DOI:
--
发表时间:
2014
期刊:
影响因子:
--
作者:
[Rie Nakamura, Anil.N.Netravali, 角田恭兵・今泉潤哉・藤井琢士・來海博央]
通讯作者:
角田恭兵・今泉潤哉・藤井琢士・來海博央
Development of Three Dimensional Strain Field Scanning Technique with Nano-Scale Special Resolution by EBSD Method and Application to Strain Silicon Semiconductor
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批准号:21760086
-
项目类别:Grant-in-Aid for Young Scientists (B)
-
资助金额:$2.58万
-
财政年份:2009
-
负责人:KIMACHI Hirohisa
-
依托单位:
Development of Multi-functional Near Field Raman Microscope for Measurement of Strain in Nano-scale Area and Application to Bio-Piezoelectric material
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批准号:19760078
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项目类别:Grant-in-Aid for Young Scientists (B)
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资助金额:$2.27万
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财政年份:2007
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负责人:KIMACHI Hirohisa
-
依托单位:
海外基金