EPSRC Access to Materials Research Equipment - 3D ESEM

点击翻译按钮获取中文摘要

Scanning Electron Microscopy (SEM) is a key technique underpinning a wide range of research in Materials Science as well as being heavily exploited in branches of Physics, Chemistry and Biological Sciences. Recent advances in SEM technology have included the integration of several complementary techniques into a single instrument providing enormous flexibility and a high degree of automation. Recent advances include operation in gaseous and liquid specimen environments (ESEM) brought about by improved vacuum control and detector technology. However, further novel in situ analysis of a greater range of materials, particularly extendable using non-vacuum conditions, represents the future synergistic direction of SEM led research. This proposal addresses the specific criteria for Specialised Scanning Electron Microscopy with relevance to Focussed Ion Beam techniques within the call. A total of 20% of spare capacity, equivalent to one working day a week, will be made available to external users.