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Bent Laue Analyzer for X-ray Fluorescence Spectroscopy

Bent Laue Analyzer for X-ray Fluorescence Spectroscopy
用于 X 射线荧光光谱分析的 Bent Laue 分析仪
批准号:
6786667
负责人:
CAHIT KARANFIL
金额:
$30.13万
依托单位:
依托单位国家:
美国
项目类别:
财政年份:
2002
资助国家:
美国
项目状态:
已结题
起止时间:
2002-06-01 至 2005-09-30

项目摘要

项目成果

CAHIT KARANFIL的其他基金

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中文摘要
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英文摘要
DESCRIPTION (provided by applicant): Our team has achieved the goals of the Phase I SBIR grant by implementing and testing our Bent Laue Analyzer design concept at a variety of x-ray energies below 15 KeV. In Phase I, we optimized, constructed and tested devices at seven different x-ray fluorescence energies between 6 and 18 KeV. Several of the devices were also successfully tested by respected XAFS experimenters at the Advanced Photon Source, and the devices have been enthusiastically received. At this point it is clear there is a significant commercial potential to our designs, even at the Phase I stage of development. We have been approached by a company with a world-wide sales presence in synchrotron radiation instrumentation who is interested in potentially marketing our analyzer technology, and particularly future integrated systems that we intend to develop. The market potential and utility for end-users will be significantly enhanced through development of turnkey systems incorporating positioners, back-end detectors, and alignment aids. In this Phase II application we propose to carry our bent Laue x-ray analyzer concept through to commercial implementation, specifically to continue to improve the performance below 6 KeV, to develop integrated multielement systems, improve manufacturing, quality control, and quality assurance capabilities, develop user documentation, and form marketing and distribution agreement(s) with an established company or companies with a world-wide sales presence. The products will provide unique and invaluable capabilities for x-ray fluorescence spectroscopy in biology, medicine, chemistry, physics, materials science, and environmental sciences.
期刊论文(1)
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会议论文
Quantitative performance measurements of bent crystal Laue analyzers for X-ray fluorescence spectroscopy.
用于 X 射线荧光光谱的弯曲晶体劳厄分析仪的定量性能测量。
DOI: 10.1107/s0909049512003937
发表时间: 2012
期刊: Journal of synchrotron radiation
影响因子: 2.5
作者: [Karanfil,C, Bunker,G, Newville,M, Segre,CU, Chapman,D]
通讯作者: Chapman,D
A Device for Selecting and Rejecting X-ray Harmonics
  • 批准号:
    6642477
  • 项目类别:
  • 资助金额:
    $12.5万
  • 财政年份:
    2003
  • 负责人:
    CAHIT KARANFIL
  • 依托单位:
Bent Laue Analyzer for X-ray Fluorescence Spectroscopy
  • 批准号:
    6485664
  • 项目类别:
  • 资助金额:
    $12.5万
  • 财政年份:
    2002
  • 负责人:
    CAHIT KARANFIL
  • 依托单位:
Bent Laue Analyzer for X-ray Fluorescence Spectroscopy
  • 批准号:
    6692062
  • 项目类别:
  • 资助金额:
    $37.95万
  • 财政年份:
    2002
  • 负责人:
    CAHIT KARANFIL
  • 依托单位: