X-ray diffraction system for texture measurements

用于纹理测量的 X 射线衍射系统

• 批准号: 390571-2010
• 负责人: Szpunar, Jerzy
• 金额: $ 10.93万
• 依托单位: University of Saskatchewan
• 依托单位国家: 加拿大
• 项目类别: Research Tools and Instruments - Category 1 (<$150,000)
• 财政年份: 2009
• 资助国家: 加拿大
• 起止时间: 2009-01-01 至 2010-12-31
• 项目状态: 已结题
• 来源: https://www.nserc-crsng.gc.ca/ase-oro/Details-Detailles_eng.asp?id=443226
• 关键词: ray; diffraction; system; texture; measurements

The X-ray diffraction texture equipment is essential for the realization of all our research projects related to texture and many other applications of X-ray diffraction. The applicant arrived to University of Saskatchewan in August 2009 with a task to establish new research program where texture investigation play an important role and do not have any research equipment at present. The texture program is expected to create novel tools for texture investigations and microstructural imaging at Canadian Light Source (CLS).

X射线衍射织构设备对于实现我们所有与织构相关的研究项目以及X射线衍射的许多其他应用至关重要。 申请人于2009年8月抵达萨斯喀彻温大学，任务是建立新的研究计划，其中纹理调查发挥重要作用，目前没有任何研究设备。 纹理程序预计将在加拿大光源（CLS）的纹理调查和显微结构成像创造新的工具。