Reflectometer system for measuring polymer thickness on substrates

用于测量基材上聚合物厚度的反射计系统

• 批准号: 391200-2010
• 负责人: Skene, William
• 金额: $ 1.96万
• 依托单位: Université de Montréal
• 依托单位国家: 加拿大
• 项目类别: Research Tools and Instruments - Category 1 (<$150,000)
• 财政年份: 2009
• 资助国家: 加拿大
• 起止时间: 2009-01-01 至 2010-12-31
• 项目状态: 已结题
• 来源: https://www.nserc-crsng.gc.ca/ase-oro/Details-Detailles_eng.asp?id=443393
• 关键词: Reflectometer; system; measuring; polymer; thickness

The equipment requested is a miniature spectrometer reflectometer system for measuring the thickness of films deposited onto surfaces. The technique is non-destructive and the thickness of the film deposited onto the substrate can be measured to with 1 nm accuracy based on the light absorbed and reflected from the surface. The instrument can measure the thickness of polymer films and brushes on transparent surfaces such as ITO electrodes and mica substrates. The instrument allows polymer thickness-properties studies of conjugated polymers for electrochromic applications as well as polymer brushes for biorelated applications. Such thickness-properties studies are important for understanding the relationship of conjugated polymer thickness with device efficiency and color contrasting for electrochromic devices. The reflectometer will also allow crucial studies of polymer brush height on mica substrates for correlating surface friction, electrostatic interactions, and entanglement with polymer brush thickness.

所要求的设备是用于测量表面沉积薄膜厚度的微型光谱仪反射计系统。该技术是非破坏性的，并且基于从表面吸收和反射的光，可以测量沉积在衬底上的薄膜的厚度，精度可达1nm。该仪器可以测量ITO电极和云母衬底等透明表面上的聚合物薄膜和电刷的厚度。该仪器允许用于电致变色应用的共轭聚合物的聚合物厚度-性能研究以及用于生物相关应用的聚合物刷。这种厚度-性质研究对于理解共轭聚合物厚度与电致变色器件效率和颜色对比的关系具有重要意义。反射计还将允许对云母衬底上的聚合物刷高度进行重要的研究，以确定表面摩擦、静电相互作用和聚合物刷厚度的纠缠。