AFM data acquisition system and controller

有了这个应用程序，我们要求一个国家的最先进的原子力显微镜控制器和数据采集系统。我们在研究绝缘离子晶体表面上有机分子的成核和生长方面取得了国际领先地位。下一个关键步骤是对附着在金属电极上的分子进行3D力场成像，以研究电荷转移以及作为系统原子结构函数的电子传输。为了实现这些目标，我们需要在更高的模式和频率下操作我们的AFM杠杆，以提高数据采集速度和分辨率，而不牺牲灵敏度。针尖-样品相互作用表现为AFM悬臂的共振频率的偏移（频率调制或nc-AFM技术）。一个主要的挑战是检测具有10-100 kHz带宽的MHz载波频率上的Hz谐振频率偏移。这可以通过最近可用的商业数字数据采集和控制系统来完成。我们现在需要这个系统来保持我们的领导地位。

With this application we request a state-of the art atomic force microscope controller and data acquisition system. We have achieved an international leadership position in investigating the nucleation and growth of organic molecules on insulating ionic crystal surfaces. A next crucial step is the 3D force field imaging of molecules attached to metal electrodes to investigate charge transfer as well as electronic transport as a function of the atomic structure of the system. To achieve these goals, we need to operate our AFM cantilevers at higher modes and thus frequencies to increase data acquisition speed and resolution without sacrificing sensitivity. Tip-sample interactions manifest themselves as a shift of the resonant frequency of the AFM cantilever (frequency modulation or nc-AFM technique). A major challenge is to detect Hz resonant frequency shifts on a MHz carrier frequency with a 10-100 kHz bandwidth. This can be done with a commercial digital data acquisition and control system that recently became available. We need this system now in order to maintain our leadership position.