Market Study of Compressed Ultrafast Transmission Electron Microscopy (CUTEM)

压缩超快透射电子显微镜 (CUTEM) 的市场研究

• 批准号: 544458-2019
• 负责人: Liang, Jinyang
• 金额: $ 0.88万
• 依托单位: Institut national de la recherche scientifique
• 依托单位国家: 加拿大
• 项目类别: Idea to Innovation
• 财政年份: 2019
• 资助国家: 加拿大
• 起止时间: 2019-01-01 至 2020-12-31
• 项目状态: 已结题
• 来源: https://www.nserc-crsng.gc.ca/ase-oro/Details-Detailles_eng.asp?id=674805
• 关键词: Market; Study; Compressed; Ultrafast; Transmission

Transmission electron microscopy (TEM) is indispensable for numerous applications, including materials science, car industry, industrial inspection, nanotechnology, life sciences, semiconductors, mining & minerals sectors, and oil & gas industry. As Grand View Research Inc. reported in October 2018, the global electron microscope market size was valued at USD 3.2 billion in 2017. It is anticipated to expand at a CAGR of 7.4% over the forecast period (2018-2025). However, most TEM machines have moderate imaging speeds up to 200 frames per second, which are ultimately limited by imaging sensors. To overcome this limitation, dynamic TEM (D-TEM) was invented, but it has various drawbacks in the sequence depth, the temporal resolution, and the field of view. Thus far, there is no existing single-shot movie-mode TEM that could record hundreds of frames with sub-nanosecond temporal resolution and nanometer spatial resolution. Recently, we invented compressed ultrafast transmission electron microscopy (CUTEM) that offers a quantum leap in imaging capability from state-of-the-art D-TEM. CUTEM combines laser-assisted TEM with computational imaging methodologies based on compressed sensing (CS). With a minimum modification of commercially available D-TEM systems, CUTEM will add two additional components. First, a transmissive mask with a binary random pattern will spatially encode the electron probe beam. Second, a linear ramp voltage will be applied to the pair(s) of sweep electrodes to temporally shear individual temporal frames. Besides innovation in hardware, the proposed method will leverage a CS-based algorithm to retrieve information in time and two-dimensional space. This invention will achieve simultaneously a picosecond temporal resolution and a nanometer spatial resolution. It will also be able to record more than 100 frames in a single acquisition. Thus, it will provide an attractive electron imaging product for capturing irreversible chemical reactions, non-repeatable structural phenomena, and difficult-to-reproduce radiation-matter interactions.

透射电子显微镜（TEM）在许多应用中不可或缺，包括材料科学、汽车工业、工业检测、纳米技术、生命科学、半导体、采矿和矿产部门以及石油和天然气行业。Grand View Research Inc.根据2018年10月的报告，2017年全球电子显微镜市场规模为32亿美元。预计在预测期内（2018-2025年）将以7.4%的复合年增长率扩张。然而，大多数TEM机器具有高达每秒200帧的中等成像速度，这最终受到成像传感器的限制。为了克服这一局限性，人们发明了动态TEM（D-TEM），但它在层序深度、时间分辨率和视场方面存在各种缺点。到目前为止，还没有现有的单次拍摄电影模式TEM可以记录数百帧的亚纳秒时间分辨率和纳米空间分辨率。 最近，我们发明了压缩超快透射电子显微镜（CUTEM），提供了一个量子飞跃的成像能力，从国家的最先进的D-TEM。CUTEM将激光辅助TEM与基于压缩感知（CS）的计算成像方法相结合。通过对商用D-TEM系统进行最小的修改，CUTEM将增加两个额外的组件。首先，具有二元随机图案的透射掩模将对电子探测束进行空间编码。第二，线性斜坡电压将被施加到扫描电极对以在时间上剪切各个时间帧。除了硬件上的创新，该方法将利用基于CS的算法来检索时间和二维空间中的信息。本发明将同时实现皮秒时间分辨率和纳米空间分辨率。它还将能够在一次采集中记录100多帧。因此，它将提供一种有吸引力的电子成像产品，用于捕获不可逆的化学反应，不可重复的结构现象和难以再现的辐射-物质相互作用。