Enhanced FTIR spectrometry for characterizing the radiative properties of surfaces

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Researchers at the University of Waterloo urgently need the capacity to determine radiative properties over visible and infrared wavelengths; isolate the specular (as opposed to hemispherical) reflectance from optically-smooth surfaces; and measure emissivity on high temperature surfaces, in order to carry out interdisciplinary research involving steel production and additive manufacturing, nanotechnology for solar photovoltaics and smart windows, and precision agriculture. The requested infrastructure are extension packages to an existing Fourier transform infrared (FTIR) spectrometer. In its current configuration the spectrometer can only measure hemispherical reflectance over infrared wavelengths, which does not realize the full potential of this instrument and does not address the needs of the above research programs. The requested enhancements will extend the measurement range into visible wavelengths, permit specular reflectance measurements, as well as high temperature measurements under controlled atmospheres, a capability that will be unique in the country. These enhancements will make the University of Waterloo the leading center for radiative property characterization across Canada. The instrument will enable a wide range of theoretical and applied research at Waterloo and surrounding institutions for many years to come, and help Canadian manufacturers address urgent challenges that cost them millions of dollars annually. The equipment will also serve as a nexus for interdisciplinary research, help recruit underrepresented groups into STEM fields, and equip graduate students with hands-on skills and theoretical knowledge needed by Canadian high tech industry and academia.