Advancing Surface Analysis Techniques and Methodologies for Materials Research

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Analytical techniques that probe the surfaces of materials are a key component in basic and applied research spanning multiple disciplines and industrial sectors. Techniques such as X-ray photoelectron spectroscopy (XPS), scanning Auger microscopy and Auger electron spectroscopy (SAM/AES), and time-of-flight secondary ion mass spectrometry (ToF-SIMS) provide a wealth of elemental, chemical state, molecular, film thickness and depth information from the outer few nanometres of solid surfaces. Applied research in materials undertaken by academia and industry requires innovative methodologies to push the boundaries of what these techniques can do. This proposal will outline further areas of advancement to be explored to overcome knowledge and quality gaps in current methodologies, thus allowing us to solve challenging advanced materials research questions. The longer-term vision for my research program is to increase the accuracy and effectiveness of specific surface analysis instruments, elucidating as much as possible from the data obtained, and establishing clear methodologies for applications spanning multiple material science disciplines. Specific objectives include 1) Advancing XPS Methodologies, 2) Analysing Scanning Auger Nanoprobe High Resolution Auger Spectra to Elucidate Transition Metal Chemistries, 3) Resolving Chemical States of Rare Earth Elements by XPS and 4) Refining the Analysis of Carbon 1s XP Spectra. The results of this program will both greatly improve upon existing methods and will create new abilities to accurately qualify and quantify various species of interest across a large range of academic research topics and industrial sectors.