Advancing Surface Analysis Techniques and Methodologies for Materials Research

推进材料研究的表面分析技术和方法

• 批准号: RGPIN-2022-04475
• 负责人: Biesinger, Mark
• 金额: $ 1.82万
• 依托单位: University of Western Ontario
• 依托单位国家: 加拿大
• 项目类别: Discovery Grants Program - Individual
• 财政年份: 2022
• 资助国家: 加拿大
• 起止时间: 2022-01-01 至 2023-12-31
• 项目状态: 已结题
• 来源: https://www.nserc-crsng.gc.ca/ase-oro/Details-Detailles_eng.asp?id=747779
• 关键词: Advancing; Surface; Analysis; Techniques; Methodologies

Analytical techniques that probe the surfaces of materials are a key component in basic and applied research spanning multiple disciplines and industrial sectors. Techniques such as X-ray photoelectron spectroscopy (XPS), scanning Auger microscopy and Auger electron spectroscopy (SAM/AES), and time-of-flight secondary ion mass spectrometry (ToF-SIMS) provide a wealth of elemental, chemical state, molecular, film thickness and depth information from the outer few nanometres of solid surfaces. Applied research in materials undertaken by academia and industry requires innovative methodologies to push the boundaries of what these techniques can do. This proposal will outline further areas of advancement to be explored to overcome knowledge and quality gaps in current methodologies, thus allowing us to solve challenging advanced materials research questions. The longer-term vision for my research program is to increase the accuracy and effectiveness of specific surface analysis instruments, elucidating as much as possible from the data obtained, and establishing clear methodologies for applications spanning multiple material science disciplines. Specific objectives include 1) Advancing XPS Methodologies, 2) Analysing Scanning Auger Nanoprobe High Resolution Auger Spectra to Elucidate Transition Metal Chemistries, 3) Resolving Chemical States of Rare Earth Elements by XPS and 4) Refining the Analysis of Carbon 1s XP Spectra. The results of this program will both greatly improve upon existing methods and will create new abilities to accurately qualify and quantify various species of interest across a large range of academic research topics and industrial sectors.

探测材料表面的分析技术是跨越多个学科和工业部门的基础和应用研究的关键组成部分。诸如X射线光电子能谱（XPS）、扫描俄歇显微镜和俄歇电子能谱（SAM/AES）以及飞行时间二次离子质谱（ToF-SIMS）等技术提供了来自外部几纳米固体表面的丰富的元素、化学状态、分子、膜厚度和深度信息。学术界和工业界开展的材料应用研究需要创新的方法来突破这些技术的界限。该提案将概述进一步探索的进步领域，以克服当前方法中的知识和质量差距，从而使我们能够解决具有挑战性的先进材料研究问题。 我的研究计划的长期愿景是提高特定表面分析仪器的准确性和有效性，从获得的数据中尽可能多地阐明，并为跨多个材料科学学科的应用建立明确的方法。具体目标包括：1）推进XPS方法学，2）分析扫描俄歇纳米探针高分辨率俄歇光谱以阐明过渡金属化学，3）通过XPS解析稀土元素的化学状态，以及4）改进碳1 s XP光谱的分析。 该计划的结果将大大改善现有的方法，并将创造新的能力，以准确地定性和量化各种感兴趣的物种在广泛的学术研究课题和工业部门。