Nanometer-to-micrometer Length Scale Mechanical and Tribological Characterization System

纳米到微米长度尺度的机械和摩擦学表征系统

• 批准号: RTI-2023-00432
• 负责人: Azhari, Faezeh
• 金额: $ 10.93万
• 依托单位: University of Toronto
• 依托单位国家: 加拿大
• 项目类别: Research Tools and Instruments
• 财政年份: 2022
• 资助国家: 加拿大
• 起止时间: 2022-01-01 至 2023-12-31
• 项目状态: 已结题
• 来源: https://www.nserc-crsng.gc.ca/ase-oro/Details-Detailles_eng.asp?id=758244
• 关键词: Nanometer; micrometer; Length; Scale; Mechanical

Surface properties (wear resistance, hardness, surface deformation) are critical to the performance requirements of many components and devices, such as biomedical devices and aerospace applications. To establish a relation between nano- and microstructure and mechanical response of material surfaces, it is important to be able to characterize local structural deformations at high resolution using nanomechanical testing for a broad range of tailored surface chemistries, films or coatings. This proposal requests a robust and all-encompassing advanced nanoindentation system (Bruker TS 77 Nanoindenter) which features an in-situ Scanning Probe Microscopy (SPM) visualization system, to simultaneously perform SPM imaging of a material surface structure, while performing nano-micrometer length scale mechanical and tribological analysis. Nanoindentation has become a powerful alternative to measure elastic modulus, hardness, creep, stress relaxation, and fracture toughness at small scales, with full control over the indenter loading and unloading rates, dynamic oscillation, peak load, and other test parameters. This technique is not limited only to surface engineering technologies but can also be used to investigate the nanometer-to-micrometer length scale mechanical and tribological behaviour of materials in general, such as: analysis of different phases in multi-phases materials, fibre-matrix interfaces in composite materials and microstructural analysis of bulk materials. The TS 77 has the unique feature of using the same probe to raster the sample surface for topography imaging (SPM) as it does to conduct the nanomechanical test, which facilitates the positioning on desired testing sites. This ability to visualize the sample surface on the same length scale as the testing grant superior nanomechanical characterization results and data reliability. Thus, nanometer precision test placement accuracy can be achieved, which ensures that the test is being conducted at the exact desired location on the material. Additionally, by using the in-situ SPM imaging capabilities on the TS 77, quantitative wear volumes and wear removal rates can be measured as a function of applied contact force, sliding speed, and number of passes, which cannot be performed in a traditional nanoindenter system. Due to the scale of testing, tribological performance of individual microstructures, interfaces, and thin films can readily be measured. Currently, there are no in situ SPM imaging nanoindentation systems available in the Toronto region. We suggest the TS 77 will be of significant value for the research, design, and optimization of engineered materials, within the academic research and industrial communities.

表面性能（耐磨性、硬度、表面变形）对于许多组件和设备的性能要求至关重要，例如生物医学设备和航空航天应用。为了建立纳米和微观结构与材料表面的机械响应之间的关系，重要的是能够使用纳米机械测试以高分辨率表征局部结构变形，用于各种定制的表面化学，薄膜或涂层。该提案要求一个强大的和全方位的先进的纳米压痕系统（布鲁克TS 77纳米压痕仪），其特点是原位扫描探针显微镜（SPM）可视化系统，同时执行材料表面结构的SPM成像，同时执行纳米-微米长度尺度的机械和摩擦学分析。纳米压痕已成为测量小尺度弹性模量、硬度、蠕变、应力松弛和断裂韧性的强大替代方案，可完全控制压头加载和卸载速率、动态振荡、峰值载荷和其他测试参数。这种技术不仅限于表面工程技术，而且还可以用于研究纳米到微米长度尺度的材料的机械和摩擦学行为，例如：多相材料中不同相的分析，复合材料中的纤维基体界面和散装材料的微观结构分析。TS 77的独特之处在于，它使用与进行纳米力学测试相同的探针对样品表面进行光栅扫描，以进行形貌成像（SPM），这有助于在所需的测试部位进行定位。这种在与测试相同的长度尺度上可视化样品表面的能力赋予了上级纳米机械表征结果和数据可靠性。因此，可以实现纳米精度的测试放置精度，这确保了测试在材料上的精确期望位置处进行。此外，通过使用TS 77上的原位SPM成像功能，可以测量定量磨损体积和磨损去除率，作为施加的接触力、滑动速度和通过次数的函数，这在传统的纳米压头系统中无法执行。由于测试的规模，单个微结构，界面和薄膜的摩擦学性能可以很容易地测量。目前，在多伦多地区还没有原位SPM成像纳米压痕系统。我们认为TS 77将在学术研究和工业界对工程材料的研究、设计和优化具有重要价值。