Determination of Surface and Interface Structures by Local and Long-Range Order Diffraction Techniques

表面和界面结构的定量知识是解决一系列重要科学问题的核心。本项目将使用多重散射方法对材料的近程和长程有序敏感的衍射谱进行数据分析。我们计划的一个主要重点是应用这些最先进的技术来研究清洁表面的结构，以及使用外延生长技术以超薄膜形式产生的亚稳态结构。这项工作的结果将对表面结晶学领域和对晶体生长的理解产生重大影响。

Quantitative knowledge of the structure of surfaces and interfaces is central to the resolution of a host of important scientific questions. This project will use multiple scattering methods for data analysis of diffraction spectroscopies sensitive to the short-range and long-range order of materials. A major focus of our program is to apply these state-of-the-art techniques to study the structure of clean surfaces and that of metastable structures produced in the form of ultra-thin films using epitaxial growth techniques. Results of this work will greatly impact on the area of surface crystallography and the understanding of crystal growth.