RUI: Development and Characterization of Organic Thin Films

该研究计划将侧重于开发和 热沉积有机薄膜的表征 真空蒸发。 该项目需要优化 薄膜的沉积过程、薄膜的结构研究 有机膜和有机膜的系统表征- 基础结构。 测量包括电流-电压 了解传导的物理过程 和击穿，电容-电压特性，以确定 表面态的性质和密度。 总体目标是 对潜在的应用进行现实的评估， 有源电子器件中的热生长膜 结构.

This research program will focus on the development and characterization of organic thin films deposited by thermal evaporation under vacuum. The project entails optimization of the thin film deposition process, structural studies of the organic films and systematic characterization of organic film- based structures. Measurements include current-voltage characteristics to understand physical processes of conduction and breakdown, capacitance-voltage characteristics to determine nature and density of surface states. The overall objective is to make a realistic assessment of potential applications of the thermally grown films in active electronic devices such as MIS structures.