Development of Instrumentation for Fundamental Studies of Thin Film Magnetism

这项研究计划的目标是开发和完善一个 用于研究外延磁性薄膜的仪器。 相 过渡测量将用于确定临界 电影的代表人物。 该小组正在努力修改 影响磁性的物质的物理性质 通过研究原子能级与材料的 结构和磁性。 正在开发的工具将 联合收割机两种互补的自旋敏感光谱技术 (Kerr效应和自旋极化二次电子发射）， MBE和薄膜结构分析能力（点轮廓 分析LEED和电子前向散射光谱）。 在单独的系统上进行的扫描隧道显微镜 将用于表征衬底。

The goal of this research program is to develop and refine an instrument for the study of epitaxial magnetic thin films. Phase transition measurements will be used to determine the critical exponents of the films. This group is working to modify the physical properties of matter that affect the magnetic behavior of materials through a study of the relation between atomic level structure and magnetism. The instrument being developed will combine two complementary spin-sensitive spectroscopic techniques (Kerr effect and spin-polarized secondary electron emission) with MBE and thin film structure analysis capabilities (spot-profile analysis LEED and electron forward scattering spectroscopy). Scanning tunneling microscopy carried out on a separate system will be used to characterize the substrates.