Electron Crystallography

建议继续开发和应用一种新的透射式电子衍射法，用于精确测量各种晶体材料中阳离子的电子密度分布。电子束技术将使PI能够研究微晶体和“真实”材料的结构。具体来说，PI的目的是：*确定包括氧化物超导体在内的各种氧化物中铜的电荷状态*研究镁的成键性质和晶体性质*测试理论计算，如结构因素和电离性在结构相变中的作用*进一步发展电子衍射技术这项研究的结果将有助于理解一些具有重要技术意义的半导体和陶瓷材料的晶体结构。

This is a proposal for the continued development and application of a new transmission electron diffraction method for accurately measuring the electron density distribution of cations in various crystalline materials. Electron beam techniques will enable the PIs to study the structure of micro-crystals and "real" materials. Specifically, the PIs intend to: * determine the charge state of Cu in various oxides including oxide superconductors * study the nature of bonding and crystal properties of MgO * test theoretical calculations such as structure factors and the role of ionicity in structural phase transitions * further develop the electron diffraction technique The results of this research will contribute to the understanding of the crystal structure of a number of technologically important semiconductor and ceramic materials.