U.S.-Australia Cooperative Research in X-ray Studies of ThinFilms and Artificial Multilayers

该奖项支持西蒙·C·莫斯博士第一年访问一次，休斯顿大学园区博士后研究员P.C.周访问一次，第二年各访问一次，访问澳大利亚维多利亚克莱顿的CSIRO，与材料科学与技术部的Stephen W.Wilkins博士在材料科学与技术部合作，研究用各种方法生产的薄膜和多层半导体的X射线微结构表征。研究人员打算选择一些材料进行深入研究，并结合他们各自的工具和理论技能来开发新的见解和分析方法。研究主题包括：(1)半导体多层(超晶格)结构；(2)非相干结构中界面的研究；(3)多层和薄膜结构中的有序化、振动效应和局域失真的研究。这三个主题在某种程度上是相互关联的，因为它们需要非常仔细地注意数据收集和分散理论。

This award supports one visit in the first year by Dr. Simon C. Moss, and one by post-doctoral researcher P.C. Chow, of the University of Houston, University Park, and one each in the second year, to CSIRO, Clayton, Victoria, Australia, to work with Dr. Stephen W. Wilkins of the Division of Materials Science and Technology on the Division of Materials Science and Technology on the x-ray microstructural characterization of thin films and multilayers of semiconductors produced by various means. The researchers intend to select a few materials for intensive study and join their respective instrumental and theoretical skills to develop new insights and analytical methods. The research topics include: (1) semiconductor multilayer (superlattice) structures; (2) studies of interfaces in incoherent structures; and (3) studies of ordering, vibrational effects and localized distortions within multilayer and thin-film structures. The three topics are somewhat interrelated in that they require very careful attention to data collection and to scattering theory.