PYI: Sequential and Combinational Test Pattern Generation for Realistic Faults Using Boolean Satisfiability

本研究基于自动测试模式生成（ATPG）系统（称为Nemesis），该系统首先构建一个表示故障所有可能测试的公式，然后对结果公式应用布尔可满足性算法，从而为给定故障生成测试模式。该方法将公式提取与公式满足分离开来，具有灵活性和通用性。基于Nemesis的测试系统正在开发中，该系统将生成检测组合和顺序集成电路中所有实际制造缺陷的测试。

Larrabee This research is based on an automatic test pattern generation (ATPG) system (called Nemesis) that generates a test pattern for a given fault by first constructing a formula representing all possible tests for the fault, and then applying a Boolean satisfiability algorithm to the resulting formula. This method separates the formula extraction from the formula satisfaction thus providing flexibility and generality. A testing system, based on Nemesis, that will generate tests detecting all realistic manufacturing defects in both combinational and sequential ICs is being developed.