Acquisition of a High Resolution Research Powder X-Ray Diffractometer

9503535施泰因芬克该合同为购买最先进的高分辨率粉末X射线衍射仪提供部分支持。主要用户将是德克萨斯大学奥斯汀分校的教职员工、研究生、助理研究员和博士后。该仪器选配了附件，以满足用户群体研究的具体需求。该仪器将至少有一个4KW的发电机，以从密封的X射线管产生高强度的X射线源。该测角仪将基于带有Peltier冷却固态探测器的theta/theta几何结构。可变的测角仪半径将允许最终的峰值分辨率为0.025 2，这在Rietveld结构精细化的数据收集中尤其重要。它将配备一台486/66或更好的计算机，其软件分析能力与材料数据公司(MDI)出售的软件分析能力相当或更好。该仪器将配备可控制大气的高温级和低温级。薄膜附件将是该系统的一部分。这些设备将放置在一个现有的实验室中，该实验室拥有所需的空间和设施。%将继续研究需要最先进的粉末衍射仪的几个研究课题。它的应用将主要用于研究氧化物和硫化物中的相变随温度和气氛的变化，研究薄膜，特别是光催化应用，以及收集数据用于Rietveld技术的晶体结构精炼。这些项目得到了各种公共和私人来源的支持。预计这些程序将构成该文书的主要时间分配。除了促进研究项目外，材料科学和工程实验室的这种设备的存在将为研究生提供材料科学重要技术方面的培训，如果这个国家要在材料时代保持竞争力和领导地位，这个领域越来越被认识到是不可或缺的。***

9503535 Steinfink This award provides partial support of the purchase of a state-of- the-art high resolution powder x-ray diffractometer. The primary users will be faculty, graduate students, research associates, and post-doctoral students at the University of Texas at Austin. The instrument has been chosen with accessories to meet the specific needs of the research requirements of the user group. The instrument will have at least a 4KW generator to produce a high-intensity x-ray source from a sealed-off x-ray tube. The goniometer will be based on a theta/theta geometry with a Peltier cooled solid state detector. A variable goniometer radius will permit an ultimate peak resolution of 0.025 2, especially important in data collection for Rietveld structure refinement. It will be equipped with a 486/66 or better computer with software analysis capabilities equivalent to or better than those sold by Materials Data Inc. (MDI). The instrument will be equipped with high and low temperature stages in which the atmosphere can be controlled. A thin film attachment will be part of the system. This equipment will be situated in an existing laboratory that has the required space and utilities. %%% Several research topics that require a state-of-the-art powder diffractometer will be pursued. Its use will be heavily devoted to the investigation of phase transitions in oxides and chalcogenides as a function of temperature and atmosphere, to the study of thin films especially for photocatalytic applications, and the collection of data for crystal structure refinement by the Rietveld technique. These projects are supported by a variety of public and private sources. It is expected that these procedures will constitute the major time allocation for this instrument. In addition to the furtherance of research projects, the presence of this equipment in the Materials Science and Engineering Laboratories will provide training of graduate students in techniques of importan ce in materials science, an area that is increasingly recognized as indispensable if this country is to maintain competitiveness and leadership in the Age of Materials. ***