Analysis of Diode Laser Facet Degradation

9614060半导体二极管激光器器件的Mead可靠性评估对于鉴定器件在较长时间内和具有挑战性的环境环境中的性能非常重要。目前估计设备可靠性的方法通常仅限于经验公式，如阿雷尼乌斯公式。这些方法通常是供应商特定的，并不能提供对环境因素的重要洞察，这些因素最大程度地影响寿命和长期可靠的运行。这项研究将探索一种利用器件的光学光谱和感兴趣区域的声子光谱非破坏性地评估半导体激光小面退化的方法。***

9614060 Mead Reliability assessment of semiconductor diode laser devices will be important for qualification of device performance over extended periods and in challenging environmental settings. Contemporary methods of estimating device reliability are typically limited to empirical formulas such as the Arrhenius expression. These methods are often vendor specific and do not provide significant insight into environmental factors that most affect longevity and reliable operation of over long periods. This research will investigate a method for non-destructively assessing degradation of diode laser facets using the optical spectra of the device and phonon spectra in the region of interest. ***